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Volumn 96, Issue 7, 2010, Pages

A nondestructive analysis of the B diffusion in Ta-CoFeB-MgO-CoFeB-Ta magnetic tunnel junctions by hard x-ray photoemission

(9) Kozina, Xeniya a Ouardi, Siham a Balke, Benjamin a Stryganyuk, Gregory a Fecher, Gerhard H a Felser, Claudia a Ikeda, Shoji b Ohno, Hideo b Ikenaga, Eiji c

a JOHANNES GUTENBERG UNIVERSITY (Germany)

b TOHOKU UNIVERSITY (Japan)

c JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; B DIFFUSION; BORON DIFFUSIONS; BULK SENSITIVITY; COMBINED EFFECT; CORE LEVEL SPECTROSCOPY; CRYSTALLINE STRUCTURE; FERMI ENERGY; HARD X RAY; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; HARD X-RAY PHOTOEMISSION; MAGNETIC TUNNEL JUNCTION; NON-DESTRUCTIVE TECHNIQUE; NONDESTRUCTIVE ANALYSIS; TUNNELING MAGNETORESISTANCE;

ANNEALING; BORON; BORON COMPOUNDS; COBALT COMPOUNDS; DIFFUSION IN SOLIDS; ELECTRIC RESISTANCE; EMISSION SPECTROSCOPY; MAGNETIC DEVICES; MAGNETIC FIELD EFFECTS; MAGNETOELECTRONICS; MAGNETORESISTANCE; PHOTOELECTRICITY; SPIN DYNAMICS; TANTALUM; TUNNEL JUNCTIONS; TUNNELING (EXCAVATION); WIND TUNNELS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77249149443 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3309702 Document Type: Article

Times cited : (64)

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