Oxygen grain-boundary transport in polycrystalline alumina using wedge-geometry bilayer samples: Effect of Y-doping

Acta Materialia

Volumn 58, Issue 7, 2010, Pages 2442-2451

  Cheng, H ^a,b   Caram, H S ^a   Schiesser, W E ^a   Rickman, J M ^a,b   Chan, H M ^a,b   Harmer, M P ^a,b  

^a Lehigh University   (United States)

^b LEHIGH UNIVERSITY   (United States)

Author keywords

Ceramics; Dopants; Grain boundaries; Grain boundary diffusion; Oxidation

Indexed keywords

ACTIVATION ENTHALPIES; BI-LAYER; DOPANTS; DUAL LAYER; GRAIN-BOUNDARY DIFFUSION; K-VALUES; MICROSTRUCTURAL OBSERVATIONS; OUTWARD DIFFUSION; OXIDATION LAYERS; POLYCRYSTALLINE ALUMINA; TEMPERATURE REGIMES; TRANSPORT BEHAVIOR; UNIFORM DISPERSIONS; Y-DOPING;

CERAMIC MATERIALS; DIFFUSION; DOPING (ADDITIVES); GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; OXIDATION; OXYGEN; RATE CONSTANTS; YTTRIUM; YTTRIUM ALLOYS;

ACTIVATED ALUMINA;

EID: 77249127485     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.12.030     Document Type: Article

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