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Volumn 44, Issue 2, 2002, Pages 319-330

Characterization and growth of oxide films

a NATIONAL RESEARCH COUNCIL CANADA (Canada)

Author keywords

Alloy; Electronic materials; Oxidation; Rare earth elements; Secondary ion mass spectrometry; X ray photoelectron spectroscopy

Indexed keywords

CHROMIUM ALLOYS; COMPOSITION EFFECTS; IRON ALLOYS; NICKEL ALLOYS; OXIDES; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR GROWTH; THERMOOXIDATION; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

OXIDE FILMS;

FILM GROWTH;

ALLOY; CORROSION PREVENTION; FILM; HIGH TEMPERATURE CORROSION; OXIDATION; RARE EARTH METAL;

EID: 0036467010 PISSN: 0010938X EISSN: None Source Type: Journal
DOI: 10.1016/S0010-938X(01)00063-4 Document Type: Article

Times cited : (43)

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