Application of surface techniques to study oxide growth processes

Materials at High Temperatures

Volumn 17, Issue 1, 2000, Pages 1-5

  Graham, M J ^a  

^a NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Fecral alloys; Oxide growth processes; Reactive elements; Semiconductors; Surface analytical techniques

Indexed keywords

EID: 10644287420     PISSN: 09603409     EISSN: None     Source Type: Journal    
DOI: 10.1179/mht.2000.002     Document Type: Article

References (32)

1. Graham, M. J. Corros. Sci. 37, 1377 (1995).
2. Graham, M. J. and Hussey, R. J. Oxid. Met. 44, 339 (1995).
3. Graham, M. J. Microscopy of Oxidation (eds M. J. Bennett and G. W. Lorimer), p. 10. The Institute of Metals, London (1991).
4. Graham, M.J., Eldridse, J. I., Mitchell, D. F. and Hussey, R. J. Mater. Sci. Forum 43, 207 (1989).
5. Hussey, R. J., Mitchell, D. F. and Graham, M. J. Werkst. Korros. 38, 575 (1987).
6. Cotell, C. M., Yurek, G. J., Hussey, R. J., Mitchell, D. F. and Graham, M. J. Oxid. Met. 34, 173 (1990).
7. Hussey, R. J., Papaiacovou, P., Shen, J., Mitchell, D. F. and Graham, M. J. Proc. Symp. Corrosion and Panicle Erosion at High Temperature (eds V. Srinivasan and K. Vedula), p. 567. IMS (1989).
8. Hussey, R. J., Papaiacovou, P., Shen, J., Mitchell, D. F. and Graham, M. J. Hater. Sci. Eng. A 120, 147 (1989).
9. Papaiacovou, P., Hussey, R. J., Mitchell, D. F. and Graham, M. J. Corros. ScJ.30,451 (1990).
10. Mitchell, D. F., Prescott, R., Graham, M. J. and Doychak, J. Proc. 3rd Int'l. SAMPE Metals Conference, Toronto, Canada, 1992, p. M78.
11. Prescott, R., Mitchell, D. F. and Graham, M. J. Corrosion 50, 62 (1994).
12. Prescott, R., Mitchell, D. F. and Graham, M. J. Microscopy of Oxidation Vol. 2 (eds S. B.Newcomb and M. J. Bennett), p. 455. The Institute of Metals, London (1993).
13. Prescott, R., Mitchell, D. F., Graham, M. J. and Doychak, J. Corros. Sci. 37, 1341(1995).
14. Mennicke, C., Schumann, E., Riihle, M., Hussey, R. J., Sproule, G. I. and Graham, M. J. Oxid. Met. 49,455 (1998).
15. Quadakkers, W. J., Norton, J. F., Penkalla, J., Brener, U., Gil, A., Rieck, T. and Hansel, M. Microscopy of Oxidation Vol. 3 (eds S. B. Newman and J. A. Little), p. 221. The Institute of Materials, London (1997).
16. Pint, B. A. Oxid. Met. 45, 1 (1996).
17. Hussey R. J. and Graham, M. J. Oxid. Met. 45, 349 (1996).
18. Jung, H. G. and Kim, K. Y. Oxid. Met. 46, 147 (1996).
19. Pint, B.A. Oxid. Met. 48, 303 (1997).
20. Jung, H. G. and Kim, K. Y.Oxid. Met. 49,403 (1998).
21. Pint, B. A. Oxid. Met. 49,531 (1998).
22. Weinbruch, S., Anastassiadis, A., Ortner, H. M., Martinz, H. P.and Wilhartitz, P. Oxid. Met. 51,111 (1999).
23. Tolpygo, V. K. Oxid. Met. 51,449 (1999).
24. Hiramatsu, N. and Stott, F. H. Oxid. Met. 51,479 (1999).
25. Josse-Courty, C., Buscail, H., Stroosnijder, M. F., Dufour, R.and Larpin, J. P. Oxid. Met. 52, 321 (1999).
26. Lu, Z. H., Graham, M. J., Jiang, D. T. and Tan, K .H. Appl. Phys. Lett. 63,2941(1993).
27. Hussey, R. J., Sproule, G. L, Mitchell, D. F. and Graham, M. J. Proc. 72//1 7/1/7. Corrosion Congress, Houston, USA, Vol. 5B, p. 3831 (1993).
28. Kish, F. A., Caracci, S. J., Holonyak, N. Jr., Hsieh, K. C., Baker, J. E., Maranowski, S. A., Sugg, A. R., Dallesasse, J. M., Fletcher, R. M., Kuo, C. P., Osentowski, T. D. and Craford, M. G. J. Electron. Mat. 2l, 1133(1992).
29. Mishra, U. M., Parikh, P., Chavarkar, P., Yen, J., Champlain, J., Thibeault, B., Reese, H., Shi, S. S., Hu, E., Zhu, L. and Speck, J. EIDM'97,21.1.1.
30. Caracci, S. J., Kramas, M. R., Holonak, N., Ludowise, M. J. and Fischer-Colbrie, A:J. Appl. Pliys. 75,2706 (1994).
31. Grudowski, P. A., Chelakara, R.V. and Dupuis, R. D. Appl. Phys. Lett. 69,388(1996).
32. Gebretsadik, H., Kamath, K., Zhou, W.-D. and Bhattacharya, P. Appl. Phys. Lett. 72, 135(1998).