Radiometric pulse and thermal imaging methods for the detection of physical defects in solar cells and Si wafers in a production environment

Solar Energy Materials and Solar Cells

Volumn 82, Issue 3, 2004, Pages 467-480

  Dunlop, Ewan D ^a   Halton, David ^a  

^a JOINT RESEARCH CENTRE   (Italy)

Author keywords

Defect detection; Radiometric IR imaging; Si wafer; Solar cell

Indexed keywords

APPROXIMATION THEORY; CRACK INITIATION; INFRARED IMAGING; LASER BEAMS; PHOTOVOLTAIC EFFECTS; PROBLEM SOLVING; RADIOMETRY; SENSITIVITY ANALYSIS; SILICON WAFERS;

DEFECT DETECTION; PRODUCTION ENVIRONMENT; RADIOMETRIC IR IMAGING; RADIOMETRIC PULSES;

SOLAR CELLS;

EID: 2042535341     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solmat.2004.02.003     Document Type: Article

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