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Applied Physics Letters

Volumn 96, Issue 6, 2010, Pages

Mobility analysis of highly conducting thin films: Application to ZnO

(4) Look, D C a Leedy, K D b Tomich, D H b Bayraktaroglu, B b

a WRIGHT STATE UNIVERSITY (United States)

b AIR FORCE RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY SCATTERING; CONCENTRATION RATIO; FITTING PARAMETERS; GA-DOPED ZNO; GAS ATMOSPHERE; HALL EFFECT MEASUREMENT; MOBILITY ANALYSIS; TWO LAYERS; ZNO;

DEPOSITION; GALLIUM; IONIZATION OF GASES; PULSED LASER DEPOSITION; PULSED LASERS; THIN FILMS; ZINC OXIDE;

CONDUCTIVE FILMS;

EID: 76749092308 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3310043 Document Type: Article

Times cited : (92)

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