메뉴 건너뛰기




Volumn 49, Issue 4, 2010, Pages 637-643

Thickness measurement system for transparent plates using dual digital versatile disc (DVD) pickups

Author keywords

[No Author keywords available]

Indexed keywords

DATA STORAGE EQUIPMENT; PICKUPS; SIGNAL RECEIVERS; THICKNESS GAGES; THICKNESS MEASUREMENT; VIDEODISKS;

EID: 76649106469     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.000637     Document Type: Article
Times cited : (13)

References (16)
  • 1
    • 84975606509 scopus 로고
    • Confocal compact scanning optical microscope based on compact disc technology
    • J. Benschop and G. V. Rosmalen, "Confocal compact scanning optical microscope based on compact disc technology," Appl. Opt. 30, 1179-1184 (1991).
    • (1991) Appl. Opt. , vol.30 , pp. 1179-1184
    • Benschop, J.1    Rosmalen, G.V.2
  • 2
    • 0026955458 scopus 로고
    • An autocollimator based on the laser head of a compact disc player
    • T. R. Armstrong and M. P. Fitzgerald, "An autocollimator based on the laser head of a compact disc player," Meas. Sci. Technol. 3, 1072-1076 (1992).
    • (1992) Meas. Sci. Technol. , vol.3 , pp. 1072-1076
    • Armstrong, T.R.1    Fitzgerald, M.P.2
  • 3
    • 0035654887 scopus 로고    scopus 로고
    • Development of a low-cost autofocusing probe for profile measurement
    • K. C. Fan, C. L. Chu, and J. I. Mou, "Development of a low-cost autofocusing probe for profile measurement," Meas. Sci. Technol. 12, 2137-2146 (2001).
    • (2001) Meas. Sci. Technol. , vol.12 , pp. 2137-2146
    • Fan, K.C.1    Chu, C.L.2    Mou, J.I.3
  • 4
    • 0346668241 scopus 로고    scopus 로고
    • Development of a high precision straightness measuring system with DVD pick-up head
    • K. C. Fan, C. L. Chu, J. L. Liao, and J. I. Mou, "Development of a high precision straightness measuring system with DVD pick-up head," Meas. Sci. Technol. 14, 47-54 (2003).
    • (2003) Meas. Sci. Technol. , vol.14 , pp. 47-54
    • Fan, K.C.1    Chu, C.L.2    Liao, J.L.3    Mou, J.I.4
  • 6
    • 0016963903 scopus 로고
    • Remote measurement of distance and thickness using a deflected laser beam
    • V. Bodlaj and E. Klement, "Remote measurement of distance and thickness using a deflected laser beam," Appl. Opt. 15, 1432-1436 (1976).
    • (1976) Appl. Opt. , vol.15 , pp. 1432-1436
    • Bodlaj, V.1    Klement, E.2
  • 7
    • 0037812357 scopus 로고    scopus 로고
    • On-line measurement of the thickness and optical quality of float glass with a sensor based on a diffractive element
    • J. Nen and K. E. Peiponen, "On-line measurement of the thickness and optical quality of float glass with a sensor based on a diffractive element," Appl. Opt. 40, 5034-5039 (2001).
    • (2001) Appl. Opt. , vol.40 , pp. 5034-5039
    • Nen, J.1    Peiponen, K.E.2
  • 8
    • 84975647288 scopus 로고
    • Thickness measurement using Young's interferometric experiment
    • J. Cees and H. J. Frankena, "Thickness measurement using Young's interferometric experiment," Appl. Opt. 27, 3869-3874 (1988).
    • (1988) Appl. Opt. , vol.27 , pp. 3869-3874
    • Cees, J.1    Frankena, H.J.2
  • 9
    • 2942707931 scopus 로고    scopus 로고
    • Wide band interferometry for thickness measurement
    • S. Constantino, O. Martinez, and J. Torga, "Wide band interferometry for thickness measurement," Opt. Express 11, 952-957 (2002).
    • (2002) Opt. Express , vol.11 , pp. 952-957
    • Constantino, S.1    Martinez, O.2    Torga, J.3
  • 10
    • 0000256332 scopus 로고    scopus 로고
    • Separation of measurement of the refractive index and the geometrical thickness by use of a wavelength-scanning interferometer with a confocal microscope
    • T. Fukano and I. Yamaguchi, "Separation of measurement of the refractive index and the geometrical thickness by use of a wavelength-scanning interferometer with a confocal microscope," Appl. Opt. 38, 4065-4073 (1999).
    • (1999) Appl. Opt. , vol.38 , pp. 4065-4073
    • Fukano, T.1    Yamaguchi, I.2
  • 11
    • 0036800769 scopus 로고    scopus 로고
    • Dualconfocal fiber-optic method for absolute measurement of refractive index and thickness of optically transparent media
    • I. K. Ilev, R.W.Waynant, K. R. Byrnes, and J. J. Anders, "Dualconfocal fiber-optic method for absolute measurement of refractive index and thickness of optically transparent media," Opt. Lett. 27, 1693-1695 (2002).
    • (2002) Opt. Lett. , vol.27 , pp. 1693-1695
    • Ilev, I.K.1    Waynant, R.W.2    Byrnes, K.R.3    Anders, J.J.4
  • 12
    • 0242269951 scopus 로고    scopus 로고
    • Low-coherence tandem interferometer for measurement of group refractive index without knowledge of the thickness of the test sample
    • A. Hirai and H. Matsumoto, "Low-coherence tandem interferometer for measurement of group refractive index without knowledge of the thickness of the test sample," Opt. Lett. 28, 2112-2114 (2003).
    • (2003) Opt. Lett. , vol.28 , pp. 2112-2114
    • Hirai, A.1    Matsumoto, H.2
  • 13
    • 4043116373 scopus 로고    scopus 로고
    • High-speed simultaneous measurement of refractive index and thickness of transparent plates by low-coherence inter-ferometry and confocal optics
    • M. Ohmi, H. Nishi, Y. Konishi, Y. Yamada, and M. Haruna, "High-speed simultaneous measurement of refractive index and thickness of transparent plates by low-coherence inter-ferometry and confocal optics," Meas. Sci. Technol. 15, 1531-1535 (2004).
    • (2004) Meas. Sci. Technol. , vol.15 , pp. 1531-1535
    • Ohmi, M.1    Nishi, H.2    Konishi, Y.3    Yamada, Y.4    Haruna, M.5
  • 14
    • 1542306758 scopus 로고    scopus 로고
    • Simultaneous measurement of surface shape and variation in optical thickness of a transparent parallel plate in wavelengthscanning Fizeau interferometer
    • K. Hibino, B. F. Oreb, P. S. Fairman, and J. Burke, "Simultaneous measurement of surface shape and variation in optical thickness of a transparent parallel plate in wavelengthscanning Fizeau interferometer," Appl. Opt. 43, 1241-1249 (2004).
    • (2004) Appl. Opt. , vol.43 , pp. 1241-1249
    • Hibino, K.1    Oreb, B.F.2    Fairman, P.S.3    Burke, J.4
  • 15
    • 33751231087 scopus 로고    scopus 로고
    • Determination of film thickness and refractive index in one measurement of phase-modulated ellipsometry
    • D. Pristinski, V. Kozlovskaya, and S. A. Sukhishvili, "Determination of film thickness and refractive index in one measurement of phase-modulated ellipsometry," Opt. Soc. Am. A 23, 2639-2644 (2006).
    • (2006) Opt. Soc. Am. A , vol.23 , pp. 2639-2644
    • Pristinski, D.1    Kozlovskaya, V.2    Sukhishvili, S.A.3
  • 16
    • 51949113279 scopus 로고    scopus 로고
    • Application of astigmatic method on the thickness measurement of the glass substrate
    • C. H. Liu and Z. H. Lee, "Application of astigmatic method on the thickness measurement of the glass substrate," Appl. Opt. 47, 3968-3972 (2008).
    • (2008) Appl. Opt. , vol.47 , pp. 3968-3972
    • Liu, C.H.1    Lee, Z.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.