Simultaneous measurement of surface shape and variations in optical thickness of a transparent parallel plate in wavelength-scanning Fizeau interferometer

Applied Optics

Volumn 43, Issue 6, 2004, Pages 1241-1249

  Hibino, Kenichi ^a   Oreb, Bozenko F ^b   Fairman, Philip S ^b   Burke, Jan ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b CSIRO   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INTERFEROMETERS; INTERFEROMETRY; LIGHT INTERFERENCE; LIGHT MODULATION; LIGHT REFLECTION; REFRACTIVE INDEX; SURFACE PROPERTIES;

OPTICAL THICKNESS; TRANSPARENT PARALLEL PLATE; WAVELENGTH SCANNING ALGORITHM; WAVELENGTH SCANNING INTERFEROMETRY;

OPTICAL VARIABLES MEASUREMENT;

EID: 1542306758     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.43.001241     Document Type: Article

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