Stability of Ti-Zr-N coatings under Xe-ion irradiation

Surface and Coatings Technology

Volumn 204, Issue 12-13, 2010, Pages 2095-2098

  Uglov, V V ^a   Rusalski, D P ^a   Zlotski, S V ^a   Sevriuk, A V ^a   Abadias, G ^b   Kislitsin, S B ^c   Kadyrzhanov, K K ^c   Gorlachev, I D ^c   Dub, S N ^d  

^a BELARUSIAN STATE UNIVERSITY   (Belarus)

^b UNIVERSITÉ DE POITIERS   (France)

^c INSTITUTE OF NUCLEAR PHYSICS   (Kazakhstan)

^d BAKUL INSTITUTE FOR SUPERHARD MATERIALS   (Ukraine)

Author keywords

Nanohardness; Protective coating; Radiation stability; Ternary nitride; Ti Zr N; Xe irradiation

Indexed keywords

AS-GROWN; BINARY NITRIDES; ELASTIC STRAIN; ELECTRICAL AND MECHANICAL PROPERTIES; ENHANCED HARDNESS; FLUENCES; GAS-COOLED FAST REACTORS; INERT GAS IONS; INERT MATRIX; ION IRRADIATION; IRRADIATED SAMPLES; IRRADIATION DAMAGE; LOW DOSE; MATERIAL PROPERTY; METAL TARGET; METALLIZATION LAYERS; PHASE AND ELEMENT COMPOSITION; RADIATION STABILITY; REACTIVE MAGNETRON CO-SPUTTERING; SEM; SI SUBSTRATES; TERNARY NITRIDE; TERNARY NITRIDES; TI-ZR-N; XRD;

CUTTING TOOLS; ELASTICITY; ELECTRIC PROPERTIES; FAST REACTORS; GAS COOLED REACTORS; HARD COATINGS; INERT GASES; IONS; IRRADIATION; MECHANICAL PROPERTIES; MICROELECTRONICS; NANOHARDNESS; PROTECTIVE COATINGS; RADIATION; REFRACTORY MATERIALS; REFRACTORY METALS; SPUTTER DEPOSITION; STRUCTURAL DESIGN; SYSTEM STABILITY; TITANIUM; XENON; ZIRCONIUM;

TITANIUM NITRIDE;

EID: 76349113131     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2009.11.023     Document Type: Article

References (16)

1. Uglov V.V., Anishchik V.M., Zlotski S.V., Abadias G., and Dub S.N. Surf. Coat. Technol. 208 (2008) 2394
2. Bajolet A., Manceau J.-P., Bruyère S., Clerc R., Proust M., Gaillard N., Giraudin J.-C., Delpech P., Montès L., and Ghibaudo G. Microelectron. Eng. 83 (2006) 2189
3. Meyer M.K., Fielding R., and Gan J. J. Nucl. Mater. 371 (2007) 281
4. Gavarini S., Toulhoat N., Peaucelle C., Martin P., Mende J., Pipon Y., and Jaffrezic H. J. Nucl. Mater. 362 (2007) 364
5. Hoerling A., Sjölén J., Willmann H., Larsson T., Odén M., and Hultman L. Thin Sold Films 516 (2008) 6421
6. Abadias G., Guerin Ph., Villechaise P., and Sauvage T. In: De Gryse R., Depla D., Poelman D., Mahieu S., Leroy W.P., and Poelman H. (Eds). Proceeding of ICTF 14 & RSD (2008) 193
7. Nuclear Physics Institute of National Nuclear Centre of Republic of Kazahstan. 50 years/Edit. K.K. Kadyrzanova.-Almaty:IYAF NYAF RK, 2007.-176 s.
8. Ziegler J.F., Biersack J.P., and Lttmark U. The stopping and range of ions in solids (1985), Pergamon, New York. http://www.srim.org www.srim.org
9. Four probe method of spedific electric resistnce measurements for semiconducting materials/Edit. N.A{cyrillic}. Poklonsky. -Minsk: Belgosuniversitet, 1998. -46 s.
10. Dub S.N., and Novikov N.V. Sverhtverd. Mater. 6 (2004) 16
11. Baron H.U., and Hauk V. Z. Metallkde 79 (1988) 127
12. Abadias G. Surf. Coat. Technol. 202 (2008) 2223
13. Oliver W.C., and Pharr G.M. J. Mater. Res. 19 (2004) 3
14. Was G.S. Fundamentals of Radiation Materials Science: Metals and Alloys (2007), Springer 827
15. G. Abadias, L. Koutsokeras, Ph. Guerin, P. Patsalas, Thin Solid Films, doi:10.1016/j.tsf.2009.07.183.
16. Abadias G., and Guerin Ph. Appl. Phys. Lett. 93 (2008) 111908