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Volumn 58, Issue 6, 2010, Pages 2112-2123

Plastic deformation mechanism of ultra-fine-grained AA6063 processed by equal-channel angular pressing

Author keywords

Backscatter contrast; ECAP; Electron backscatter diffraction; Scanning TEM; UFG material

Indexed keywords

BACKSCATTERED ELECTRONS; COMPLETE INFORMATION; COMPLEX MICROSTRUCTURES; ELECTRON BACK SCATTER DIFFRACTION; HIGH ANGLE GRAIN BOUNDARIES; INTERACTION OF DISLOCATIONS; LOW ANGLE GRAIN BOUNDARIES; LOW-VOLTAGE; PLASTIC DEFORMATION MECHANISMS; SCANNING TEM; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STRAIN RATE SENSITIVITY; TENSILE TESTS; UFG MATERIALS; YIELD STRENGTH;

EID: 76249109104     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.11.053     Document Type: Article
Times cited : (47)

References (46)
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    • Grain size effects on the mechanical behaviour of polycrystalline nickel from micro to nanoscale
    • Vehoff H. (Ed), Shaker Verlag ISBN 978-3-832-5833-7
    • Yang B. Grain size effects on the mechanical behaviour of polycrystalline nickel from micro to nanoscale. In: Vehoff H. (Ed). Saarbrücker Reihe Band 8 (2006), Shaker Verlag ISBN 978-3-832-5833-7
    • (2006) Saarbrücker Reihe Band 8
    • Yang, B.1
  • 46
    • 79952505809 scopus 로고    scopus 로고
    • Reimer L. (Ed), Springer-Verlag, Berlin
    • In: Reimer L. (Ed). Scanning electron microscopy (2008), Springer-Verlag, Berlin
    • (2008) Scanning electron microscopy


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.