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Volumn 58, Issue 6, 2010, Pages 2112-2123
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Plastic deformation mechanism of ultra-fine-grained AA6063 processed by equal-channel angular pressing
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Author keywords
Backscatter contrast; ECAP; Electron backscatter diffraction; Scanning TEM; UFG material
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Indexed keywords
BACKSCATTERED ELECTRONS;
COMPLETE INFORMATION;
COMPLEX MICROSTRUCTURES;
ELECTRON BACK SCATTER DIFFRACTION;
HIGH ANGLE GRAIN BOUNDARIES;
INTERACTION OF DISLOCATIONS;
LOW ANGLE GRAIN BOUNDARIES;
LOW-VOLTAGE;
PLASTIC DEFORMATION MECHANISMS;
SCANNING TEM;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
STRAIN RATE SENSITIVITY;
TENSILE TESTS;
UFG MATERIALS;
YIELD STRENGTH;
BACKSCATTERING;
COMPLEXATION;
ELECTRON DIFFRACTION;
ELECTRONS;
GRAIN BOUNDARIES;
GRAIN SIZE AND SHAPE;
MECHANICAL PROPERTIES;
METAL PRESSING;
MICROSTRUCTURE;
PRESSING (FORMING);
SCANNING;
SCANNING ELECTRON MICROSCOPY;
STRAIN RATE;
TENSILE STRENGTH;
TENSILE TESTING;
TRANSMISSION ELECTRON MICROSCOPY;
EQUAL CHANNEL ANGULAR PRESSING;
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EID: 76249109104
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/j.actamat.2009.11.053 Document Type: Article |
Times cited : (47)
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References (46)
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