Surface characterization of poly(methylmethacrylate) based nanocomposite thin films containing Al2O3 and TiO2 nanoparticles

Thin Solid Films

Volumn 518, Issue 10, 2010, Pages 2683-2687

  Lewis, S ^a   Haynes, V ^a   Wheeler Jones, R ^b   Sly, J ^a   Perks, R M ^b   Piccirillo, L ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b CARDIFF UNIVERSITY   (United Kingdom)

Author keywords

Aluminum oxide; Atomic force microscopy; Electron beam resist; Nanocomposites; Nanoparticles; Poly(MethylMethAcrylate); Titanium oxide

Indexed keywords

ALUMINUM OXIDE; ALUMINUM OXIDES; ELECTRON BEAM RESIST; NANOCOMPOSITE THIN FILMS; NANOPARTICLE SUSPENSION; OXIDE NANOPARTICLES; POOR QUALITY FILMS; SURFACE CHARACTERIZATION; TIO;

ALUMINUM; ATOMIC FORCE MICROSCOPY; ELECTRON BEAMS; METHANOL; NANOCOMPOSITES; NANOPARTICLES; PHOTORESISTS; POLYMER FILMS; SURFACE PROPERTIES; SURFACE ROUGHNESS; SUSPENSIONS (FLUIDS); THIN FILMS; TITANIUM; TITANIUM OXIDES; TOLUENE; ZETA POTENTIAL;

POLYMER MATRIX COMPOSITES;

EID: 76049110284     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.09.005     Document Type: Article

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