Improved ohmic contacts on pentacene based on Au with ultraviolet irradiation treatment

Thin Solid Films

Volumn 518, Issue 10, 2010, Pages 2707-2709

  Lin, Yow Jon ^a   Chu, Jian An ^a   Su, Yu Chao ^a   Lee, Ching Ting ^b   Chang, Hsing Cheng ^c  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^c FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

Contact resistance; Ohmic contact; Organic semiconductor; Surface treatment

Indexed keywords

AU SURFACES; CONTACT RESISTIVITIES; CURRENT VOLTAGE; ORGANIC SEMICONDUCTOR; PENTACENES; ULTRAVIOLET IRRADIATIONS;

CONTACT RESISTANCE; ELECTRIC CONTACTORS; IRRADIATION; OHMIC CONTACTS; OXYGEN; SEMICONDUCTING ORGANIC COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

SURFACE TREATMENT;

EID: 76049091232     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.09.102     Document Type: Article

References (29)

1. Lin Y.Y., Gundlach D.J., Jackson T.N., and Nelson S.F. IEEE Trans. Electron Devices 44 (1997) 1325
2. Daraktchiev M., von Mhlenen A., Nesch F., Schaer M., Brinkmann M., Bussac M.-N., and Zuppiroli L. New J. Phys. 7 (2005) 133
3. Lee J., Hwang D.K., Park C.H., Kim S.S., and Im S. Thin Solid Films 451-452 (2004) 12
4. Choo M.H., Hong W.S., and Im S. Thin Solid Films 420-421 (2002) 492
5. Wang S.D., Minari T., Miyadera T., Tsukagoshi K., and Aoyagi Y. Appl. Phys. Lett. 91 (2007) 203508
6. Klauk H. Organic Electronics (2006), WILEY-VCH, Weinheim
7. Katz H.E., and Bao Z. J. Phys. Chem., B 104 (2000) 671
8. Knipp D., and Street R.A. J. Non-Cryst. Solids 338-340 (2004) 595
9. Voz C., Puigdollers J., Martin I., Munoz D., Orpella A., Vetter M., and Alcubilla R. Sol. Energy Mater. Sol. Cells 87 (2005) 567573
10. Yoo S., Domercq B., and Kippelen B. Appl. Phys. Lett. 85 (2004) 5427
11. Yun D.J., Lee D.K., Jeon H.K., and Rhee S.W. Org. Eectron. Spectr. Data 8 (2007) 690
12. Hong K., Lee J.W., Yang S.Y., Shin K., Jeon H., Kim S.H., Yang C., and Park C.E. Org. Electron. Spectr. Data 9 (2008) 21
13. Jaeckel B., Sambur J.B., and Parkinson B.A. J. Appl. Phys. 103 (2008) 063719
14. Hong K., Yang S.Y., Yang C., Kim S.H., Choi D., and Park C.E. Org. Electron. Spectr. Data 9 (2008) 864
15. Kim W.K., and Lee J.L. Appl. Phys. Lett. 88 (2006) 262102
16. Diao L., and Frisbie C.D. J. Appl. Phys. 101 (2007) 014510
17. Lin Y.J., Yang F.M., Chou W.Y., and Chang J. Jpn. J. Appl. Phys. 47 (2008) 7851
18. Campbell I.H., Davids P.S., Smith D.L., Barashkov N.N., and Ferraris J.P. Appl. Phys. Lett. 72 (1998) 1863
19. Shen Y., Klein M.W., Jacobs D.B., Scott J.C., and Malliaras G.G. Phys. Rev. Lett. 86 (2001) 3867
20. Silveira W.R., and Marohn J.A. Phys. Rev. Lett. 93 (2006) 116104
21. Gundlach D.J., Zhou L., Nichols J.A., Jackson T.N., Necliudov P.V., and Shur M.S. J. Appl. Phys. 100 (2006) 024509
22. Yoneya N., Noda M., Hirai N., Nomoto K., Wada M., and Kasahara J. Appl. Phys. Lett. 85 (2004) 4663
23. Klauk H., Schmid G., Radlik W., Weber W., Zhou L., Sheraw C.D., Nichols J.A., and Jackson T.N. Solid-State Electron. 47 (2003) 297
24. Giraudet L., Fauveaux S., Simonetti O., Petit C., Blary K., Maurel T., and Belkhir A. Synth. Met. 156 (2006) 838
25. Schroder D.K. Semiconductor Material and Device Characterization. 3nd ed (2006), John Wiley & Sons, New York
26. Park S.P., Kim S.S., Kim J.H., Whang C.N., and Im S. Appl. Phys. Lett. 80 (2002) 2872
27. Morkoç H. Nitride Semiconductors and Devices (1999), Springer, Berlin
28. Nádaždy V., Durný R., Puigdollers J., Voz C., Cheylan S., and Gmucová K. Appl. Phys. Lett. 90 (2007) 092112
29. Vollmer A., Jurchescu O.D., Arfaoui I., Salzmann I., Palstra T.T.M., Rudolf P., Niemax J., Pfiaum J., Rabe J.P., and Koch N. Eur. Phys. J., E Soft Matter 17 (2005) 339