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Volumn 268, Issue 3-4, 2010, Pages 374-378
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XPS characterization of different thermal treatments in the ITO-Si interface of a carbonate-textured monocrystalline silicon solar cell
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Author keywords
Alkaline texturization; ITO; Silicon; Solar cells; XPS
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Indexed keywords
ALKALINE TEXTURIZATION;
ANNEALING TREATMENTS;
MONOCRYSTALLINE;
MONOCRYSTALLINE SILICON SOLAR CELLS;
SI SURFACES;
SI WAFER;
SI-BASED SOLAR CELLS;
SILICON SUBSTRATES;
SILICON SURFACES;
SPUTTERED LAYERS;
TEXTURIZATION;
THERMAL TREATMENT;
XPS;
XPS CHARACTERIZATION;
HEAT TREATMENT;
ITO GLASS;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON;
SODIUM;
SOLAR CELLS;
X RAY PHOTOELECTRON SPECTROSCOPY;
SILICON WAFERS;
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EID: 75849149152
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2009.09.044 Document Type: Article |
Times cited : (17)
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References (13)
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