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Volumn 268, Issue 3-4, 2010, Pages 374-378

XPS characterization of different thermal treatments in the ITO-Si interface of a carbonate-textured monocrystalline silicon solar cell

Author keywords

Alkaline texturization; ITO; Silicon; Solar cells; XPS

Indexed keywords

ALKALINE TEXTURIZATION; ANNEALING TREATMENTS; MONOCRYSTALLINE; MONOCRYSTALLINE SILICON SOLAR CELLS; SI SURFACES; SI WAFER; SI-BASED SOLAR CELLS; SILICON SUBSTRATES; SILICON SURFACES; SPUTTERED LAYERS; TEXTURIZATION; THERMAL TREATMENT; XPS; XPS CHARACTERIZATION;

EID: 75849149152     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.09.044     Document Type: Article
Times cited : (17)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.