Note: A simple, convenient, and reliable method to prepare gold scanning tunneling microscope tips

Review of Scientific Instruments

Volumn 81, Issue 1, 2010, Pages

  Qian, Guoguang ^a   Saha, Swatilekha ^a   Lewis, K M ^a  

^a Rensselaer Polytechnic Institute   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT LIMITS; ETCHING PARAMETERS; ETCHING PROCESS; LABORATORY INSTRUMENTATION; SCANNING TUNNELING MICROSCOPES; SIMPLE METHOD;

SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; WIND TUNNELS;

ELECTROCHEMICAL ETCHING;

EID: 75749107906     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3293459     Document Type: Review

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