An alternative isolation of tungsten tips for a scanning tunneling microscope

Review of Scientific Instruments

Volumn 76, Issue 10, 2005, Pages 1-4

  Abelev, E ^a   Sezin, N ^a   Ein Eli, Y ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; ELECTROCHEMISTRY; ETCHING; ORGANIC SOLVENTS; TUNGSTEN;

CATHOPHORETIC PAINT DEPOSITION; NONAQUEOUS ORGANIC SOLVENTS;

SCANNING TUNNELING MICROSCOPY;

EID: 27544493857     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2075187     Document Type: Review

References (12)

1. G. Binning and H. Rohrer, Helv. Phys. Acta 55, 726 (1982).
2. P. J. Bryant, H. S. Kim, Y. C. Zheng, and R. Yang, Rev. Sci. Instrum. 58, 1115 (1987).
3. P. K. Hansma and J. Tersoff, J. Appl. Phys. 61, R1 (1986).
4. H. Neddermeyer, Trends Analyt. Chem. 8, 230 (1989).
5. G. W. Stupian and M. S. Leung, Rev. Sci. Instrum. 60, 181 (1989).
6. R. Guckenberger, C. Kösslinger, R. Gatz, H. Breu, N. Levai, and W. Baumeister, Ultramicroscopy 25, 111 (1988).
7. J. P. Ibe, P. P. Bey, Jr., S. L. Brandow, R. A. Brizzolara, N. A. Burnham, D. P. DiLella, K. P. Lee, C. R. K. Marrian, and R. J. Colton, J. Vac. Sci. Technol. A 8, 3570 (1990).
8. I. Ekvall, E. Wahlström, D. Claesson, H. Olin, and E. Olsson, Meas. Sci. Technol. 10, 11 (1999).
9. R. Kazinczi, E. Szcs, E. Kalman, and P. Nagy, Appl. Phys. A 66, S535 (1998).
10. M. Klain and G. Schwitzgebel, Rev. Sci. Instrum. 68, 3099 (1997).
11. A. I. Olivia, A. Romero, and J. L. Pena, Rev. Sci. Instrum. 67, 1917 (1996).
12. M. A. Dayton, J. C. Brown, K. J. Stutts, and R. M. Wightman, Anal. Chem. 52, 946 (1980).