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Volumn 33, Issue 5, 2004, Pages 326-333
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EPMA and μ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments
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Author keywords
[No Author keywords available]
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Indexed keywords
GLASS;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
MICROSTRUCTURE;
SYNCHROTRON RADIATION;
CHEMICAL COMPOSITIONS;
CRYSTALLINE INHOMOGENEITIES;
ELECTRON PROBE MICROANALYSES;
ELECTRON-PROBE MICROANALYSIS;
GLASS FRAGMENTS;
MICROSTRUCTURE CHARACTERIZATION;
RADIATION-INDUCED;
SMALL-CRYSTALLINE;
STRUCTURAL INFORMATION;
X RAY FLUORESCENCE;
ELECTRON PROBE MICROANALYSIS;
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EID: 4544240913
PISSN: 00498246
EISSN: None
Source Type: Journal
DOI: 10.1002/xrs.734 Document Type: Article |
Times cited : (18)
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References (22)
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