-
3
-
-
0001318962
-
-
Bard A.J., and Rubinstein I. (Eds), Marcel Dekker, New York (chapter 2)
-
Finklea H.O. In: Bard A.J., and Rubinstein I. (Eds). Electroanalytical Chemistry vol. 19 (1996), Marcel Dekker, New York (chapter 2)
-
(1996)
Electroanalytical Chemistry
, vol.19
-
-
Finklea, H.O.1
-
6
-
-
0342459190
-
-
Laibinis P.E., Whitesides G.M., Allara D.L., Tao Y.-T., Parikh A.N., and Nuzzo M.G. J. Am. Chem. Soc. 113 (1991) 7152
-
(1991)
J. Am. Chem. Soc.
, vol.113
, pp. 7152
-
-
Laibinis, P.E.1
Whitesides, G.M.2
Allara, D.L.3
Tao, Y.-T.4
Parikh, A.N.5
Nuzzo, M.G.6
-
16
-
-
0032095713
-
-
Imanishi A., Isawa K., Matsui F., Tsuduki T., Yokoyama T., Kondoh H., Kitajima Y., and Ohta T. Surf. Sci. 407 (1998) 282
-
(1998)
Surf. Sci.
, vol.407
, pp. 282
-
-
Imanishi, A.1
Isawa, K.2
Matsui, F.3
Tsuduki, T.4
Yokoyama, T.5
Kondoh, H.6
Kitajima, Y.7
Ohta, T.8
-
18
-
-
0000567311
-
-
Ron H., Cohen H., Matlis S., Rappaport M., and Rubinstein I. J. Phys. Chem. B 102 (1998) 9861
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 9861
-
-
Ron, H.1
Cohen, H.2
Matlis, S.3
Rappaport, M.4
Rubinstein, I.5
-
19
-
-
0001646986
-
-
Sung M.M., Sung K., Kim C.G., Lee S.S., and Kim Y. J. Phys. Chem. B 104 (2000) 2273
-
(2000)
J. Phys. Chem. B
, vol.104
, pp. 2273
-
-
Sung, M.M.1
Sung, K.2
Kim, C.G.3
Lee, S.S.4
Kim, Y.5
-
22
-
-
0037128056
-
-
Laffineur F., Delhalle J., Guittard S., Géribaldi S., and Mekhalif Z. Colloids Surf. A: Physicochem. Eng. Aspects 198-200 (2002) 817
-
(2002)
Colloids Surf. A: Physicochem. Eng. Aspects
, vol.198-200
, pp. 817
-
-
Laffineur, F.1
Delhalle, J.2
Guittard, S.3
Géribaldi, S.4
Mekhalif, Z.5
-
23
-
-
0142118475
-
-
Whelan C.M., Kinsella M., Carbonell L., Ho H.M., and Maex K. Microelectron. Eng. 70 (2003) 551
-
(2003)
Microelectron. Eng.
, vol.70
, pp. 551
-
-
Whelan, C.M.1
Kinsella, M.2
Carbonell, L.3
Ho, H.M.4
Maex, K.5
-
24
-
-
40149093525
-
-
Sinapi F., Julien S., Auguste D., Hevesi L., Delhalle J., and Mekhalif Z. Electrochim. Acta 53 (2008) 4228
-
(2008)
Electrochim. Acta
, vol.53
, pp. 4228
-
-
Sinapi, F.1
Julien, S.2
Auguste, D.3
Hevesi, L.4
Delhalle, J.5
Mekhalif, Z.6
-
26
-
-
44449157053
-
-
Mekhalif Z., Fonder G., Auguste D., Laffineur F., and Delhalle J. J. Electroanal. Chem. 618 1-2 (2008) 24
-
(2008)
J. Electroanal. Chem.
, vol.618
, Issue.1-2
, pp. 24
-
-
Mekhalif, Z.1
Fonder, G.2
Auguste, D.3
Laffineur, F.4
Delhalle, J.5
-
28
-
-
54549121489
-
-
Amato C., Devillers S., Calas P., Delhalle J., and Mekhalif Z. Langmuir 24 (2008) 10879
-
(2008)
Langmuir
, vol.24
, pp. 10879
-
-
Amato, C.1
Devillers, S.2
Calas, P.3
Delhalle, J.4
Mekhalif, Z.5
-
29
-
-
67649342180
-
-
Fonder G., Cecchet F., Peremans A., Thiry P.A., Delhalle J., and Mekhalif Z. Surface Sci. 603 (2009) 2276
-
(2009)
Surface Sci.
, vol.603
, pp. 2276
-
-
Fonder, G.1
Cecchet, F.2
Peremans, A.3
Thiry, P.A.4
Delhalle, J.5
Mekhalif, Z.6
-
31
-
-
0032023247
-
-
Mekhalif Z., Delhalle J., Pireaux J.-J., Noël S., Houzé F., and Boyer L. Surface Coatings Technol. 100-101 (1998) 463
-
(1998)
Surface Coatings Technol.
, vol.100-101
, pp. 463
-
-
Mekhalif, Z.1
Delhalle, J.2
Pireaux, J.-J.3
Noël, S.4
Houzé, F.5
Boyer, L.6
-
32
-
-
0033328263
-
-
Noël S., Houzé F., Boyer L., Mekhalif Z., Caudano R., and Delhalle J. J. IEEE Trans. Comp. Pack. Technol. 22 (1999) 79
-
(1999)
J. IEEE Trans. Comp. Pack. Technol.
, vol.22
, pp. 79
-
-
Noël, S.1
Houzé, F.2
Boyer, L.3
Mekhalif, Z.4
Caudano, R.5
Delhalle, J.6
-
34
-
-
25144445968
-
-
Tortech L., Mekhalif Z., Delhalle J., Guittard F., and Géribaldi S. Thin Solid Films 491 (2005) 253
-
(2005)
Thin Solid Films
, vol.491
, pp. 253
-
-
Tortech, L.1
Mekhalif, Z.2
Delhalle, J.3
Guittard, F.4
Géribaldi, S.5
-
36
-
-
0037154922
-
-
Mekhalif Z., Massi L., Guittard F., Geribaldi S., and Delhalle J. Thin Solid Films 405 (2002) 186
-
(2002)
Thin Solid Films
, vol.405
, pp. 186
-
-
Mekhalif, Z.1
Massi, L.2
Guittard, F.3
Geribaldi, S.4
Delhalle, J.5
-
48
-
-
3442898749
-
-
Monnell J.D., Stapleton J.J., Jackiw J.J., Dunbar T., Reinerth W.A., Dirk S.M., Tour J.M., Allara D.L., and Weiss P.S. J. Phys. Chem. B 108 (2004) 9834
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 9834
-
-
Monnell, J.D.1
Stapleton, J.J.2
Jackiw, J.J.3
Dunbar, T.4
Reinerth, W.A.5
Dirk, S.M.6
Tour, J.M.7
Allara, D.L.8
Weiss, P.S.9
-
50
-
-
27744512099
-
-
Monnell J.D., Stapleton J.J., Dirk S.M., Reinerth W.A., Tour J.M., Allara D.L., and Weiss P.S. J. Phys. Chem. B 109 (2005) 20343
-
(2005)
J. Phys. Chem. B
, vol.109
, pp. 20343
-
-
Monnell, J.D.1
Stapleton, J.J.2
Dirk, S.M.3
Reinerth, W.A.4
Tour, J.M.5
Allara, D.L.6
Weiss, P.S.7
-
52
-
-
23144463905
-
-
Shaporenko A., Cyganik P., Buck M., Terfort A., and Zharnikov M. J. Phys. Chem. 109 (2005) 13630
-
(2005)
J. Phys. Chem.
, vol.109
, pp. 13630
-
-
Shaporenko, A.1
Cyganik, P.2
Buck, M.3
Terfort, A.4
Zharnikov, M.5
-
53
-
-
24944483109
-
-
Shaporenko A., Cyganik P., Buck M., Ulman A., and Zharnikov M. Langmuir 21 (2005) 8204
-
(2005)
Langmuir
, vol.21
, pp. 8204
-
-
Shaporenko, A.1
Cyganik, P.2
Buck, M.3
Ulman, A.4
Zharnikov, M.5
-
55
-
-
1942481178
-
-
Bain C.D., Troughton E.B., Tao Y.-T., Evall J., Whitesides G.M., and Nuzzo R.G. J. Am. Chem. Soc. 111 (1989) 321
-
(1989)
J. Am. Chem. Soc.
, vol.111
, pp. 321
-
-
Bain, C.D.1
Troughton, E.B.2
Tao, Y.-T.3
Evall, J.4
Whitesides, G.M.5
Nuzzo, R.G.6
-
57
-
-
0000985184
-
-
Garrell R.L., Chadwick J.E., Severance D.L., McDonald N.A., and Myles D.C. J. Am. Chem. Soc. 117 (1995) 11563
-
(1995)
J. Am. Chem. Soc.
, vol.117
, pp. 11563
-
-
Garrell, R.L.1
Chadwick, J.E.2
Severance, D.L.3
McDonald, N.A.4
Myles, D.C.5
-
61
-
-
0001276149
-
-
Scott J.R., Baker L.S., Everett W.R., Wilkins C.L., and Fritsch I. Anal. Chem. 69 (1997) 2636
-
(1997)
Anal. Chem.
, vol.69
, pp. 2636
-
-
Scott, J.R.1
Baker, L.S.2
Everett, W.R.3
Wilkins, C.L.4
Fritsch, I.5
-
66
-
-
34249021526
-
-
Silien C., Dreesen L., Cecchet F., Thiry P.A., and Peremans A. J. Phys. Chem. C 111 (2007) 6357
-
(2007)
J. Phys. Chem. C
, vol.111
, pp. 6357
-
-
Silien, C.1
Dreesen, L.2
Cecchet, F.3
Thiry, P.A.4
Peremans, A.5
-
68
-
-
49949083475
-
-
Kwon S., Choi Y., Choi J., Kang H., Chung H., and Noh J. Ultramicroscopy 108 (2008) 1311
-
(2008)
Ultramicroscopy
, vol.108
, pp. 1311
-
-
Kwon, S.1
Choi, Y.2
Choi, J.3
Kang, H.4
Chung, H.5
Noh, J.6
-
72
-
-
6444227417
-
-
Ryan D., Parviz B.A., Linder V., Semetey V., Sia S.K., Su J., Mrksich M., and Whitesides G.M. Langmuir 20 (2004) 9080
-
(2004)
Langmuir
, vol.20
, pp. 9080
-
-
Ryan, D.1
Parviz, B.A.2
Linder, V.3
Semetey, V.4
Sia, S.K.5
Su, J.6
Mrksich, M.7
Whitesides, G.M.8
-
73
-
-
0004234411
-
-
ASM international pp. 1-1140
-
Electronic Materials Handbook vol. 1 (1989), ASM international pp. 1-1140
-
(1989)
Electronic Materials Handbook
, vol.1
-
-
-
74
-
-
0003459529
-
-
Perkin-Elmer Corp, Eden Prairie
-
Moulder J.F., Stickle W.F., Sobol P.E., and Bomben K.D. Handbook of X-ray Photoelectron Spectroscopy (1992), Perkin-Elmer Corp, Eden Prairie
-
(1992)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Moulder, J.F.1
Stickle, W.F.2
Sobol, P.E.3
Bomben, K.D.4
-
76
-
-
0003828439
-
-
Briggs D., and Seah M.P. (Eds), Wiley, Chichester
-
In: Briggs D., and Seah M.P. (Eds). Practical Surface Analysis (1983), Wiley, Chichester
-
(1983)
Practical Surface Analysis
-
-
-
78
-
-
84891712728
-
-
Blaudez D., Buffeteau T., Cornut J.C., Desbat B., Escafre N., Pezolet M., and Turlet J.M. Appl. Spectrosc. 47 (1993) 869
-
(1993)
Appl. Spectrosc.
, vol.47
, pp. 869
-
-
Blaudez, D.1
Buffeteau, T.2
Cornut, J.C.3
Desbat, B.4
Escafre, N.5
Pezolet, M.6
Turlet, J.M.7
-
81
-
-
0031556152
-
-
Tsao M.-W., Hoffmann C.L., Rabolt J.F., Johnson H.E., Castner D.G., Erdelen C., and Ringsdorf H. Langmuir 13 (1997) 4317
-
(1997)
Langmuir
, vol.13
, pp. 4317
-
-
Tsao, M.-W.1
Hoffmann, C.L.2
Rabolt, J.F.3
Johnson, H.E.4
Castner, D.G.5
Erdelen, C.6
Ringsdorf, H.7
-
82
-
-
74549140392
-
25 X molecules adsorption on copper sheets, X (-SH, -S-S-, -SeH and -Se-Se-)
-
10.1016/j.electacta.2009.10.023
-
25 X molecules adsorption on copper sheets, X (-SH, -S-S-, -SeH and -Se-Se-). Electrochim. Acta (2009) 10.1016/j.electacta.2009.10.023
-
(2009)
Electrochim. Acta
-
-
Fonder, G.1
Volcke, C.2
Csoka, B.3
Delhalle, J.4
Mekhalif, Z.5
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