XRD and XPS characterization of mixed valence Mn 3 O 4 hausmannite thin films prepared by chemical spray pyrolysis technique

Applied Surface Science

Volumn 256, Issue 9, 2010, Pages 2920-2926

  Moses Ezhil Raj, A ^a   Victoria, S Grace ^b   Jothy, V Bena ^b   Ravidhas, C ^c   Wollschläger, Joachim ^d   Suendorf, M ^d   Neumann, M ^d   Jayachandran, M ^e   Sanjeeviraja, C ^f  

^a SCOTT CHRISTIAN COLLEGE AUTONOMOUS   (India)

^b WOMEN S CHRISTIAN COLLEGE   (India)

^c BISHOP HEBER COLLEGE   (India)

^d UNIVERSITY OF OSNABRÜCK   (Germany)

^e CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE   (India)

^f ALAGAPPA UNIVERSITY   (India)

Author keywords

AFM; Spray pyrolysis; Thin films; XPS; XRD

Indexed keywords

ATMOSPHERIC PRESSURE; CRACKING (CHEMICAL); FILM PREPARATION; MANGANESE OXIDE; SPRAY PYROLYSIS; SUBSTRATES; SURFACE CHEMISTRY; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS; X RAY DIFFRACTION;

ATOMIC FORCE MICROGRAPHS; CHEMICAL SPRAY PYROLYSIS; MANGANESE ACETATE; SPRAY-PYROLYSIS TECHNIQUES; SUBSTRATE TEMPERATURE; TEMPERATURE RANGE; THERMOGRAVIMETRY ANALYSIS; XPS CHARACTERIZATION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 75249101302     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2009.11.051     Document Type: Article

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