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Volumn 193, Issue , 2009, Pages
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Perturbative vs non-perturbative impurity scattering in a narrow Si nanowire GAA transistor: A NEGF study
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 74549132456
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/193/1/012047 Document Type: Conference Paper |
Times cited : (8)
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References (12)
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