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Volumn 427, Issue 1-3, 2006, Pages 62-66
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Thickness dependent photoconducting properties of ZnO films
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Author keywords
[No Author keywords available]
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Indexed keywords
PHOTOCONDUCTIVITY;
SCANNING ELECTRON MICROSCOPY;
SOL-GELS;
ULTRAVIOLET RADIATION;
X RAY DIFFRACTION;
ZINC OXIDE;
FIELD EMISSION SCANNING ELECTRON MICROGRAPH (FESEM);
MICROSTRUCTURAL PROPERTIES;
PHOTOCONDUCTING PROPERTIES;
PHOTORESPONSE;
THIN FILMS;
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EID: 33746374075
PISSN: 00092614
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cplett.2006.06.022 Document Type: Article |
Times cited : (71)
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References (35)
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