Modeling of thermal stresses and lifetime prediction of planar solid oxide fuel cell under thermal cycling conditions

Journal of Power Sources

Volumn 195, Issue 8, 2010, Pages 2310-2318

  Liu, Lin ^a   Kim, Gap Yong ^a   Chandra, Abhijit ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

Degradation; Failure; Modeling; SOFC; Thermal cycling; Thermal stress

Indexed keywords

ANODE-SUPPORTED; CELL LAYERS; CRACK DAMAGE; CRACK NUCLEATION; DAMAGE EVOLUTION; DEGRADATION FAILURE; FAILURE; FREE EDGE; INITIAL DAMAGE; INTERFACIAL LAYER; INTERFACIAL SHEAR STRESS; LIFETIME PREDICTION; LOCALIZED DAMAGE; MECHANICAL FAILURES; NUMBER OF CYCLES; OPERATING TEMPERATURE; PEELING STRESS; PLANAR SOLIDS; THERMAL CYCLE;

BIOMECHANICS; CRACKS; DEGRADATION; ELECTROLYSIS; ELECTROLYTES; FAILURE (MECHANICAL); LEAD OXIDE; MATHEMATICAL MODELS; MECHANICAL PROPERTIES; SHEAR STRESS; STRENGTH OF MATERIALS; THERMAL CYCLING; THERMAL STRESS; THERMOELASTICITY;

SOLID OXIDE FUEL CELLS (SOFC);

EID: 74249098019     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpowsour.2009.10.064     Document Type: Article

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