Study on the method of the accuracy evaluation of sub-pixel location operators

Guangxue Xuebao/Acta Optica Sinica

Volumn 29, Issue 12, 2009, Pages 3446-3451

  Liu, Guodong ^a   Liu, Bingguo ^a   Chen, Fengdong ^a   Hu, Tao ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Computer simulation; Gray moment; Standard image; Sub pixel location; Vision measurement

Indexed keywords

ACCURACY EVALUATION; AREA INTERPOLATION; OBJECTIVE STANDARD; OPTICAL IMAGING; STANDARD IMAGES; SUB PIXELS; SUB-PIXEL LOCATION; VISION MEASUREMENT;

COMPUTATIONAL METHODS; COMPUTER SIMULATION; IMAGE CODING; STANDARDIZATION;

PIXELS;

EID: 74049150776     PISSN: 02532239     EISSN: None     Source Type: Journal    
DOI: 10.3788/AOS20092912.3446     Document Type: Article

References (10)

1. Yang Yong, Wang Yanlei, Li Ming et al.. Research of high-accuracy digital image correlation measurement system [J]. Acta Optica Sinica, 2006, 26(2): 197-201.
2. Wu Haibin, Yu Xiaoyang, Guan Congrong. Structured light encoding stripe edge detection based on grey curve intersecting point [J]. Acta Optica Sinica, 2008, 28(6): 1085-1090.
3. Jia Yunde. Machine Vision [M]. Beijing: Science Press. 2000: 100-101.
4. Zhang Yonghong, Hu Dejin, Zhang Kai et al.. Gray moment operators for subpixel edge detection on CCD images [J]. Optical Technique. 2004, 30(6): 693-698.
5. Cui Jiwen, Tan Jiubin. Algorithm for edge subpixel location based on Zernike moment [J]. Optical Technique, 2005, 31(5): 779-782.
6. Y. Shan, G. W. Boon. Sub-pixel location of edges with non-uniform blurring: a finite closed-form approach [J]. Image and Vision Computing, 2000, (18): 1015-1023.
7. J. Elder, S. Zucker. Local scale control for edge detection and blur estimation [J]. IEEE Trans. Patt. Anal. Intell. Mach. 1998, 20(7): 699-716.
8. He Zhonghai, Wang Baoguang, Liao Yibai. Study of method for generating ideal edges [J]. Optics and Precision Engineering, 2002, 10(1): 89-93.
9. Sun Juan, Chen Wenjing, Su Xianyu et al.. Study the measurement range of wavelet transform profilom [J]. Acta Optica Sinica, 2007, 27(4): 647-653.
10. Mao Xianfu, Su Xianyu, Chen Wenjing et al.. Analysis on measurement method of improved fourier transforms profilometry [J]. Acta Optica Sinica, 2008, 28(7): 1291-1295.