Algorithm for edge subpixel location based on Zernike moment

Guangxue Jishu/Optical Technique

Volumn 31, Issue 5, 2005, Pages

  Cui, Ji Wen ^a   Tan, Jiu Bin ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

Edge model; Resolution of image; Subpixel location; Zernike moment mask

Indexed keywords

EID: 26844438115     PISSN: 10021582     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)