Local scale control for edge detection and blur estimation

IEEE Transactions on Pattern Analysis and Machine Intelligence

Volumn 20, Issue 7, 1998, Pages 699-716

  Elder, James H ^a,b   Zucker, Steven W ^a,c  

^a IEEE   (Canada)

^b YORK UNIVERSITY   (Canada)

^c YALE UNIVERSITY   (United States)

Author keywords

Blur estimation; Defocus; Edge detection; Localization; Scale space; Shadows

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; SENSORS;

LOCAL SCALE CONTROL;

EDGE DETECTION;

EID: 0032124014     PISSN: 01628828     EISSN: None     Source Type: Journal    
DOI: 10.1109/34.689301     Document Type: Article

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