Automated diffraction tomography combined with electron precession: A new tool for ab initio nanostructure analysis

Materials Research Society Symposium Proceedings

Volumn 1184, Issue , 2009, Pages 11-23

  Kolb, Ute ^a   Gorelik, Tatiana ^a   Mugnaioli, Enrico ^a  

^a JOHANNES GUTENBERG UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTRONS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; TOMOGRAPHY;

DIFFRACTION ANALYSIS; DIFFRACTION TOMOGRAPHY; ELECTRON PRECESSION; NANOSTRUCTURE ANALYSIS; ORGANIC CRYSTAL STRUCTURES; PRECESSION TECHNIQUES; STRUCTURE SOLUTIONS; THREE-DIMENSIONAL ELECTRONS;

CRYSTAL STRUCTURE;

EID: 74049111237     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-1184-gg01-05     Document Type: Conference Paper

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