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Volumn 76-78, Issue , 2009, Pages 410-415

Analysis of fixed abrasive pads with a nano-sized diamond for silicon wafer polishing

Author keywords

Fixed abrasive pad; Nano sized diamond; Silicon wafer polishing

Indexed keywords

DIAMOND ABRASIVE; DISTILLED WATER; ENVIRONMENTAL PROBLEMS; FIXED ABRASIVE PADS; FIXED ABRASIVES; FREE ABRASIVE; HIGH HARDNESS; NANO-SIZED; NANO-SIZED DIAMOND; PAD CONDITIONER; PAD MATERIAL; POLISHING PADS; PRIMARY FUNCTIONS; WAFER SURFACE; WORK PIECES;

EID: 73949127512     PISSN: 10226680     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/AMR.76-78.410     Document Type: Conference Paper
Times cited : (9)

References (5)
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  • 3
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    • doi:10.1016/S0007-8506(07)60880-4
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    • Komanduri, R.1    Lucca, D.A.2    Tani, Y.3
  • 5
    • 58149517826 scopus 로고    scopus 로고
    • doi:10.4028/www.scientific.net/KEM.389-390.487
    • P.L. Tso and C.Y. Shih: Key Eng. Mater. Vol.389-390 (2009), p. 487-492 doi:10.4028/www.scientific.net/KEM.389-390.487
    • (2009) Key Eng. Mater. , vol.389-390 , pp. 487-492
    • Tso, P.L.1    Shih, C.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.