Surface nematic liquid crystal bistability on low-symmetry photoalignment micropatterns

Liquid Crystals

Volumn 37, Issue 1, 2010, Pages 31-36

  Niitsuma, J ^a,c   Yoneya, M ^a,b   Yokoyama, H ^a,b,d  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^c JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^d KENT STATE UNIVERSITY   (United States)

Author keywords

Bistability; Micropattern; Photoalignment; Symmetry

Indexed keywords

EID: 73949119695     PISSN: 02678292     EISSN: 13665855     Source Type: Journal    
DOI: 10.1080/02678290903359283     Document Type: Article

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