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Volumn 420, Issue 6912, 2002, Pages 159-162

Tristable nematic liquid-crystal device using micropatterned surface alignment

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC FIELDS; ROBUSTNESS (CONTROL SYSTEMS);

EID: 0037079010     PISSN: 00280836     EISSN: None     Source Type: Journal    
DOI: 10.1038/nature01163     Document Type: Article
Times cited : (343)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.