Differential near-field scanning optical microscopy with THz quantum cascade laser sources

Optics Express

Volumn 17, Issue 26, 2009, Pages 23785-23792

  Degl'Innocenti, R ^a   Montinaro, M ^a   Xu, J ^a   Piazza, V ^a   Pingue, P ^a   Tredicucci, A ^a   Beltram, F ^a   Beere, H E ^b   Ritchie, D A ^b  

^a INFM   (Italy)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE DIFFERENCE TIME DOMAIN METHOD; PHOTORESISTS; QUANTUM CASCADE LASERS;

FINITE DIFFERENCE TIME DOMAIN SIMULATIONS; LIMITING FACTORS; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; QUANTUM CASCADES; SIGNAL TO NOISE; SPECTRAL REGION; SUBWAVELENGTH RESOLUTION; THZ QUANTUM CASCADE LASERS;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ACOUSTIC MICROSCOPY; ARTICLE; COMPUTER AIDED DESIGN; DIODE LASER; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; ILLUMINATION; IMAGE ENHANCEMENT; INSTRUMENTATION; TERAHERTZ IMAGING; TERAHERTZ RADIATION;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; LASERS, SEMICONDUCTOR; LIGHTING; MICROSCOPY, ACOUSTIC; TERAHERTZ IMAGING; TERAHERTZ RADIATION;

EID: 73949097565     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.023785     Document Type: Article

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