Advanced terahertz electric near-field measurements at sub-wavelength diameter metallic apertures

Optics Express

Volumn 16, Issue 10, 2008, Pages 7407-7417

  Adam, A J L ^a   Brok, J M ^a   Seo, M A ^b   Ahn, K J ^b   Kim, D S ^b   Kang, J H ^c   Park, Q H ^c   Nagel, M ^d   Planken, P C M ^a,e  

^a Lab Fluid Dynam Heat Transf E   (Netherlands)

^b Seoul National University   (South Korea)

^c Korea University   (South Korea)

^d RWTH AACHEN UNIVERSITY   (Germany)

^e FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SOURCES; OPTICAL RESOLVING POWER; SUBMILLIMETER WAVES; SURFACE CHARGE;

METALLIC APERTURES; NEAR-FIELD OUTPUT; TIME-DERIVATIVE;

ELECTRIC FIELD MEASUREMENT;

METAL;

ARTICLE; CHEMISTRY; ELECTRICITY; ELECTROCHEMISTRY; EQUIPMENT DESIGN; METHODOLOGY; MICROSCOPY; OPTICS; PHYSICAL CHEMISTRY; RADIATION SCATTERING; RAMAN SPECTROMETRY; SPECTROPHOTOMETRY; STATISTICAL MODEL; THEORETICAL MODEL; TIME;

CHEMISTRY, PHYSICAL; ELECTRICITY; ELECTROCHEMISTRY; EQUIPMENT DESIGN; METALS; MICROSCOPY; MODELS, STATISTICAL; MODELS, THEORETICAL; OPTICS; SCATTERING, RADIATION; SPECTROPHOTOMETRY; SPECTRUM ANALYSIS, RAMAN; TIME FACTORS;

EID: 43849083227     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.007407     Document Type: Article

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