Differential near-field scanning optical microscopy

Nano Letters

Volumn 6, Issue 11, 2006, Pages 2609-2616

  Ozcan, Aydogan ^a   Cubukcu, Ertugrul ^b   Bilenca, Alberto ^a   Crozier, Kenneth B ^b   Bouma, Brett E ^a   Capasso, Federico ^b   Tearney, Guillermo J ^a  

^a HARVARD MEDICAL SCHOOL   (United States)

^b HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PARALLELOGRAMS; RECTANGULAR APERTURE; SCANNING POSITION;

COMPUTATIONAL GEOMETRY; IMAGE RECONSTRUCTION; IMAGE RECORDING; OPTICAL RESOLVING POWER; SCANNING;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SCANNING PROBE MICROSCOPY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, SCANNING PROBE; NANOTECHNOLOGY; PARTICLE SIZE; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTIES;

EID: 33846121633     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl062110v     Document Type: Article

References (25)

1. Novotny, L.; Hecht, B. Principles of Nano-Optics; Cambridge University Press: New York, 2006.
2. Lewis, A.; Isaacson, M.; Harootunian, A.; Muray, A. Ultramicroscopy 1984, 13, 227.
3. Pohl, D. W.; Denk, W.; Lanz, M. Appl. Phys. Lett. 1984, 44, 651.
4. Fischer, U. Ch. J. Vac. Sci. Technol. B 1985, 3, 386.
5. Betzig, E.; Lewis, A.; Harootunian, A.; Isaacson, M.; Kratschmer, E. Biophys. J. 1986, 49, 269.
6. Betzig, E.; Trautman, J. K.; Harris, T. D.; Weiner, J. S.; Kostelak, R. L. Science 1991, 251, 1468.
7. Betzig, E.; Chichester, R. J. Science 1993, 262, 1422.
8. Betzig, E.; Finn, P. L.; Weiner, J. S. Appl. Phys. Lett. 1992, 60, 2484.
9. Inouye, Y.; Kawata, S. Opt. Lett. 1994, 19, 159.
10. Ephrat, P.; Roodenko, K.; Nagli, L.; Katzir, A. Appl. Phys. Lett. 2004, 84, 637.
11. Rasmussen A.; Deckert V. Anal. Bioanal. Chem. 2005, 381, 165.
12. Mitsui, T. Rev. Sci. Instrum. 2005, 76, 043703-1.
13. Gan, Q.; et al. Appl. Phys. Lett. 2006, 88, 121111.
14. Bethe, H. A. Phys. Rev. 1944, 66, 163.
15. Garcia de Abajo, F. J. Opt. Express 2002, 10, 1475.
16. Heng, X., Erickson, D.; Demetri, P.; Changhuei, Y. Proc. SPIE. 2005, 6003, 40.
17. Zenhausern, F.; Martin, Y.; Wickramasinghe, H. K. Science 1995, 269, 1083.
18. Knoll, B.; Keilmann, F. Nature 1999, 399, 134.
19. Yang, T. J.; Lessard, G. A.; Quake, S. R. Appl. Phys. Lett. 2000, 76, 378.
20. Keilmann, F.; Hillenbrand, R. Philos. Trans. R. Soc. London, Ser. A 2004, 362, 787.
21. Barbara, A.; Lopez-Rios, T.; Quemerais, P. Rev. Sci. Instrum. 2005, 76, 023704-1.
22. Goodman, J. W. Introduction to Fourier Optics; McGraw-Hill: New York, 1996.
23. Carney, P. S.; Schotland, J. C. Appl. Phys. Lett. 2000, 77, 2798.
24. Carney, P. S.; Markel, A. M.; Schotland, J. C. Phys. Rev. Lett. 2001, 86, 5874.
25. Starck, J. L.; Murtagh, F.; Bijaoui, A. Image Processing and Data Analysis: The Multiscale Approach; Cambridge University Press: Cambridge. U.K., 1998.