Structural and magnetic properties of transition metal doped ZnO films

Thin Solid Films

Volumn 518, Issue 8, 2010, Pages 2152-2156

  Jin, C G ^a   Y Gao, ^b   Wu, X M ^a   Cui, M L ^a   Zhuge, L J ^a   Chen, Z C ^a   Hong, B ^a  

^a SOOCHOW UNIVERSITY   (China)

^b Shandong College of Electronic Technology   (China)

Author keywords

Ferromagnetism; Sputtering; Thin Films; X ray Diffraction; Zinc Oxide; ZnO:metal

Indexed keywords

MAGNETIC MEASUREMENTS; POLYCRYSTALLINE; RADIO FREQUENCY MAGNETRON SPUTTERING; STRUCTURAL AND MAGNETIC PROPERTIES; WURTZITE STRUCTURE; ZNO; ZNO:METAL;

CHROMIUM; DIFFRACTION; FERROMAGNETISM; MAGNETIC PROPERTIES; METALS; OXIDE FILMS; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE; ZINC SULFIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 73949085260     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.09.047     Document Type: Article

References (41)

1. Dietl T. Semicond. Sci. Technol. 17 (2002) 377
2. Prinz G.A. Science 282 (1998) 1660
3. Ohno H. Science 281 (1998) 951
4. Awschalom D.D., and Kawakami R.K. Nature 408 (2000) 923
5. Awschalom D.D., and Kikkawa J.M. Phys. Today 52 (1999) 33
6. Ohno H., Chibu D., Matsukura F., Omiya T., Abe E., Dietl T., Ohno Y., and Ohtani K. Nature 408 (2000) 944
7. Ohno H., Munekata H., Penney T., von Molnar S., and Chang L.L. Phys. Rev. Lett. 68 (1992) 2664
8. de Boeck J., and Borghs G. Phys. World 12 (1999) 27
9. Dietl T., Ohno H., Matsukura F., Cibert J., and Ferrand D. Science 287 (2000) 1019
10. Risbud S., Spaldin N.A., Chen Z.Q., and Stemmer S. Ram Swshadri. Phys. Rev. B 68 (2003) 205202
11. Huang J.C.A., Hsu H.S., Hu Y.M., Lee C.H., Huang Y.H., and Lin M.Z. Appl. Phys. Lett. 85 (2004) 3815
12. Rode K., Anane A., Mattana R., Coutour J.-P., Durand O., and LeBourgeois R. J. Appl. Phys. 93 (2003) 7676
13. Park J.H., Kim M.G., Jang H.M., Ryu S.W., and Kim Y.M. Appl. Phys. Lett. 84 (2004) 1338
14. Debernardia A., and Fanciulli M. Appl. Phys. Lett. 90 (2007) 212510
15. Venkatesan M., Stamenov P., Dorneles L.S., and Gunning R.D. Appl. Phys. Lett. 90 (2007) 242508
16. Hou D.L., Ye X.J., Meng H.J., Zhou H.J., Li X.L., Zhen C.M., and Tang G.D. Appl. Phys. Lett. 90 (2007) 142502
17. Chakraborti D., and Narayan J. Appl. Phys. Lett. 90 (2007) 062504
18. Martinez B., Sandiumenge F., Balcells Ll., Arbiol J., Sibieude F., and Monty C. J. Magn. Magn. Mater. 290-291 (2005) 168
19. Xu C.X., Sun X.W., Dong Z.L., Yu M.B., Xiong Y.Z., and Chen J.S. Appl. Phys. Lett. 86 (2005) 173110
20. Li J.H., Shen D.Z., Zhang J.Y., Zhao D.X., Li B.S., Lu Y.M., Liu Y.C., and Fan X.W. J. Magn. Magn. Mater. 302 (2006) 118
21. Maensiri S., Laokul P., and Klinkaewnarong J. J. Magn. Magn. Mater. 302 (2006) 448
22. Martinez B., Sandiumenge F., Balcells Ll., Arbiol J., Sibieude F., and Monty C. Appl. Phys. Lett. 86 (2005) 103113
23. Wagner C.D., Riggs W.M., Davis L.E., Moulder J.F., and Muilenberg G.E. Handbook of X-Ray Photoelectron Spectroscopy (1978), Perkin-Elmer, Eden Prairie, MN
24. Zhao L.Y., Eldridge K.R., Sukhija K., Jalili H., Heinig N.F., and Leung K.T. Appl. Phys. Lett. 88 (2006) 033111
25. [25] Powder Diffraction File, Joint Committee on Powder Diffraction Standards, ASTM, Philadelphia, PA, 1967, Card 36-1451.
26. Ueda, Tabata, and Kawai. Appl. Phys. Lett. 79 (2001) 988
27. Lee H.J., Jeong S.Y., Cho C.R., and Park C.H. Appl. Phys. Lett. 81 (2002) 4020
28. Kim Y.M., Yoon M., Park I.-W., Park Y.J., and Lyou JongH. Solid State Commun. 129 (2004) 175
29. Jung S.W., An S.J., Yi G., Jung C.U., Lee S., and Cho S. Appl. Phys. Lett. 80 (2002) 4561
30. Jin Z.W., Fukumura T., Kawasaki M., Ando K., Saito H., Sekiguchi T., Yoo Y.Z., Murakami M., Matsumoto Y., Hasegawa T., and Koinuma H. Appl. Phys. Lett. 78 (2001) 3824
31. Liu C., Yun F., Xiao B., Cho S.J., Moon Y.T., Morkoç H., Morad A., Ruterana R., Yu K.M., and Walukiewicz W. J. Appl. Phys. 97 (2005) 126107
32. Xu C., Hassel M., Kuhlenbeck H., and Freund H.J. Surf. Sci. 258 (1991) 23
33. Venezia A.M., Loxon C.M., and Horton J.A. Surf. Sci. 225 (1990) 195
34. Maetaki A., Yamamoto M., Matsumoto H., and Kishi K. Surf. Sci. 445 (2000) 80
35. Cullity B.D. Elements of X-ray Diffraction. 2nd ed (1978), Addison-Wesley, Massachusetts 350
36. Kim K.J., and Park Y.R. J. Appl. Phys. 96 (2004) 4150
37. Koshihara S., Oiwa A., Hirasawa M., Katsumoto S., Iye Y., Urano C., Takagi H., and Munekata H. Phys. Rev. Lett. 78 (1997) 4617
38. Lee H.J., Kim B.S., Cho C.R., and Jeong S.Y. Phys. Status. Solidi B 241 (2004) 1533
39. Chen Z.C., Zhuge L.J., and Wu X.M. Thin Solid Films 515 (2007) 5462
40. Park Y.D., Hanbicki A.T., Erwin S.C., Hellberg C.S., Sullivan J.M., Mattson J.E., Ambrose T.F., Wilson A., Spanos G., and Jonker B.T. Science 295 (2002) 651
41. Hung-Ta L., Tsung-Shune C., Jhy-Chau S., Show-Hau L., Tzay-Ming H., Rong-Tan H., Fu-Rong C., and Ji-Jung K. Appl. Phys. Lett. 85 (2004) 621