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Volumn 106, Issue 12, 2009, Pages

Standing-wave excited photoemission experiments on Si/MoSi2 multilayer mirrors in the soft x-ray regime: An analytical modeling approach

(8) Döring, Sven a Schönbohm, Frank a Weier, Daniel a Lehmkühler, Felix a Berges, Ulf a Tolan, Metin a Fadley, Charles S b,c Westphal, Carsten a

a TU DORTMUND UNIVERSITY (Germany)

b UNIVERSITY OF CALIFORNIA (United States)

c UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL APPROACH; ANALYTICAL MODELING; CHEMICAL STATE; DEPTH PROFILE; EXPERIMENTAL DATA; EXPERIMENTAL TEST; KEY PARAMETERS; MULTI-LAYER MIRRORS; PHOTOELECTRON INTENSITIES; PHOTOEMISSION SPECTROSCOPY; SOFT X-RAY; WAVE EXCITATION; X-RAY STANDING WAVES;

ELASTIC WAVES; EMISSION SPECTROSCOPY; EXPERIMENTS; PHOTOEMISSION; STATISTICAL TESTS; WAVES; X RAY ANALYSIS;

MULTILAYERS;

EID: 73849116700 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3272783 Document Type: Article

Times cited : (10)

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