Spectroscopic characterization of buried interfaces using soft X-ray standing waves

Synchrotron Radiation News

Volumn 17, Issue 3, 2004, Pages 24-29

  Yang, S H ^c   Mun, B S ^b   Fadley, C S ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33646364127     PISSN: 08940886     EISSN: 19317344     Source Type: Journal    
DOI: 10.1080/08940880408603091     Document Type: Article

References (11)

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