Depth-resolved photoemission spectroscopy from surface and buried layers with soft X-ray standing waves

Surface Science

Volumn 461, Issue 1-3, 2000, Pages

  Yang, S H ^a   Mun, B S ^a,b   Kay, A W ^a,b   Kim, S K ^a,c   Kortright, J B ^a   Underwood, J H ^a   Hussain, Z ^a   Fadley, C S ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

Boron; Carbides; Diffusion and migration; Soft X ray photoelectron spectroscopy; Tungsten; X ray standing waves

Indexed keywords

EID: 0001695560     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00617-8     Document Type: Article

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