-
2
-
-
84911406494
-
-
Keddie, J. L.; Jones, R. A. L.; Cory, R. A. Europhys. Lett. 1994, 27, 59-64.
-
(1994)
Europhys. Lett
, vol.27
, pp. 59-64
-
-
Keddie, J.L.1
Jones, R.A.L.2
Cory, R.A.3
-
4
-
-
73649132028
-
-
Forrest, J. A.; Dalnoki-Veress, K.; Dutcher, J. R. Phys. Rev. E 1997, 56, 5105-5116.
-
(1997)
Phys. Rev. E
, vol.56
, pp. 5105-5116
-
-
Forrest, J.A.1
Dalnoki-Veress, K.2
Dutcher, J.R.3
-
9
-
-
22344434161
-
-
Priestley, R. D.; Ellison, C. J.; Broadbelt, L. J.; Torkelson, J. M. Science 2005, 309, 456-459.
-
(2005)
Science
, vol.309
, pp. 456-459
-
-
Priestley, R.D.1
Ellison, C.J.2
Broadbelt, L.J.3
Torkelson, J.M.4
-
10
-
-
0035902704
-
-
Wallace, W. E.; Fischer, D. A.; Efimenko, K.; Wu, W. L.; Genzer, J. Macromolecules 2001, 34, 5081-5082.
-
(2001)
Macromolecules
, vol.34
, pp. 5081-5082
-
-
Wallace, W.E.1
Fischer, D.A.2
Efimenko, K.3
Wu, W.L.4
Genzer, J.5
-
11
-
-
66549126812
-
-
Rotella, C.; Napolitano, S.; Wübbenhorst, M. Macromolecules 2009, 42, 1415-1417.
-
(2009)
Macromolecules
, vol.42
, pp. 1415-1417
-
-
Rotella, C.1
Napolitano, S.2
Wübbenhorst, M.3
-
12
-
-
0029291170
-
-
Toney, M. F.; Russell, T. P.; Logan, J. A.; Kikuchi, H.; Sands, J. M.; Kumar, S. K. Nature 1995, 374, 709-711.
-
(1995)
Nature
, vol.374
, pp. 709-711
-
-
Toney, M.F.1
Russell, T.P.2
Logan, J.A.3
Kikuchi, H.4
Sands, J.M.5
Kumar, S.K.6
-
13
-
-
63049090075
-
-
Tocha, E.; Schonherr, H.; Vancso, J. Soft Matter 2009, 5, 1489-1495.
-
(2009)
Soft Matter
, vol.5
, pp. 1489-1495
-
-
Tocha, E.1
Schonherr, H.2
Vancso, J.3
-
17
-
-
9744280618
-
-
Buck, E.; Petersen, K.; Hund, M.; Krausch, G.; Johannsmann, D. Macromolecules 2004, 37, 8647-8652.
-
(2004)
Macromolecules
, vol.37
, pp. 8647-8652
-
-
Buck, E.1
Petersen, K.2
Hund, M.3
Krausch, G.4
Johannsmann, D.5
-
18
-
-
0035827002
-
-
Kerle, T.; Lin, Z.; Kim, H. C.; Russell, T. P. Macromolecules 2001, 34, 3484-3492.
-
(2001)
Macromolecules
, vol.34
, pp. 3484-3492
-
-
Kerle, T.1
Lin, Z.2
Kim, H.C.3
Russell, T.P.4
-
19
-
-
34047116006
-
-
Mundra, M. K.; Donthu, S. K.; Dravid, V. P.; Torkelson, J. M. Nano Lett. 2007, 7, 713-718.
-
(2007)
Nano Lett
, vol.7
, pp. 713-718
-
-
Mundra, M.K.1
Donthu, S.K.2
Dravid, V.P.3
Torkelson, J.M.4
-
20
-
-
0142037327
-
-
Chou, S. Y.; Krauss, P. R.; Renstrom, P. J. Appl. Phys. Lett. 1995, 67, 3114-3116.
-
(1995)
Appl. Phys. Lett
, vol.67
, pp. 3114-3116
-
-
Chou, S.Y.1
Krauss, P.R.2
Renstrom, P.J.3
-
26
-
-
0037435847
-
-
Kim, H.; Ruhm, A.; Lurio, L. B.; Basu, J. K.; Lal, J.; Lumma, D.; Mochrie, S. G. J.; Sinha, S. K. Phys. Rev. Lett. 2003, 90, 068302.
-
(2003)
Phys. Rev. Lett
, vol.90
, pp. 068302
-
-
Kim, H.1
Ruhm, A.2
Lurio, L.B.3
Basu, J.K.4
Lal, J.5
Lumma, D.6
Mochrie, S.G.J.7
Sinha, S.K.8
-
28
-
-
0037851024
-
-
Roth, C. B.; Nickel, B. G.; Dutcher, J. R.; Dalnoki-Veress, K. Rev. Sci. Instrum. 2003, 74, 2796-2804.
-
(2003)
Rev. Sci. Instrum
, vol.74
, pp. 2796-2804
-
-
Roth, C.B.1
Nickel, B.G.2
Dutcher, J.R.3
Dalnoki-Veress, K.4
-
29
-
-
0036873952
-
-
Huang, X. D.; Bao, L. R.; Cheng, X.; Guo, J.; Pang, S. W.; Yee, A. F. J. Vac. Sci. Technol. B 2002, 20, 2872-2876.
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, pp. 2872-2876
-
-
Huang, X.D.1
Bao, L.R.2
Cheng, X.3
Guo, J.4
Pang, S.W.5
Yee, A.F.6
-
30
-
-
33845234261
-
-
Ro, H. W.; Ding, Y. F.; Lee, H. J.; Hines, D. R.; Jones, R. L.; Lin, E. K.; Karim, A.; Wu, W. L.; Soles, C. L. J. Vac. Sci. Technol. B 2006, 24, 2973-2978.
-
(2006)
J. Vac. Sci. Technol. B
, vol.24
, pp. 2973-2978
-
-
Ro, H.W.1
Ding, Y.F.2
Lee, H.J.3
Hines, D.R.4
Jones, R.L.5
Lin, E.K.6
Karim, A.7
Wu, W.L.8
Soles, C.L.9
-
31
-
-
33748329685
-
-
Jones, R. L.; Hu, T.; Soles, C. L.; Lin, E. K.; Reano, R. M.; Pang, S. W.; Casa, D. M. Nano Lett. 2006, 6, 1723-1728.
-
(2006)
Nano Lett
, vol.6
, pp. 1723-1728
-
-
Jones, R.L.1
Hu, T.2
Soles, C.L.3
Lin, E.K.4
Reano, R.M.5
Pang, S.W.6
Casa, D.M.7
-
32
-
-
0032465356
-
-
Majeste, J. C.; Montfort, J. P.; Allal, A.; Marin, G. Rheol. Acta 1998, 37, 486-499.
-
(1998)
Rheol. Acta
, vol.37
, pp. 486-499
-
-
Majeste, J.C.1
Montfort, J.P.2
Allal, A.3
Marin, G.4
-
34
-
-
0000271106
-
-
Plazek, D. J.; O'Rourke, V. M. J. Polym. Sci., Part A-2 1971, 9, 209-243.
-
(1971)
J. Polym. Sci., Part A-2
, vol.9
, pp. 209-243
-
-
Plazek, D.J.1
O'Rourke, V.M.2
-
35
-
-
73649115730
-
-
Note that the initial line width is 33 nm and the wavelength is 200 nm. Throughout the surface wave decay, the space in between lines is wider than the lines (see Figure Id). To estimate viscosity using eq 2, 150 nm is assumed for the wavelength near the end of the slumping, and 75 nm is assumed in the beginning.
-
Note that the initial line width is 33 nm and the wavelength is 200 nm. Throughout the surface wave decay, the space in between lines is wider than the lines (see Figure Id). To estimate viscosity using eq 2, 150 nm is assumed for the wavelength near the end of the slumping, and 75 nm is assumed in the beginning.
-
-
-
-
36
-
-
0034296625
-
-
Gautam, K. S.; Schwab, A. D.; Dhinojwala, A.; Zhang, D.; Dougal, S. M.; Yeganeh, M. S. Phys. Rev. Lett. 2000, 85, 3854-3857.
-
(2000)
Phys. Rev. Lett
, vol.85
, pp. 3854-3857
-
-
Gautam, K.S.1
Schwab, A.D.2
Dhinojwala, A.3
Zhang, D.4
Dougal, S.M.5
Yeganeh, M.S.6
-
41
-
-
0024108611
-
-
Yee, A. F.; Bankert, R. J.; Ngai, K. L.; Rendell, R. W. J. Polym. Sci., Part B: Polym. Phys. 1988, 26, 2463-2483.
-
(1988)
J. Polym. Sci., Part B: Polym. Phys
, vol.26
, pp. 2463-2483
-
-
Yee, A.F.1
Bankert, R.J.2
Ngai, K.L.3
Rendell, R.W.4
-
42
-
-
0027693968
-
-
Ngai, K. L.; Roland, C. M.; Yee, A. F. Rubber Chem. Technol. 1993, 66, 817-826.
-
(1993)
Rubber Chem. Technol
, vol.66
, pp. 817-826
-
-
Ngai, K.L.1
Roland, C.M.2
Yee, A.F.3
-
43
-
-
18144427514
-
-
Si, L.; Massa, M. V.; Dalnoki-Veress, K.; Brown, H. R.; Jones, R. A. L. Phys. Rev. Lett. 2005, 94, 127801.
-
(2005)
Phys. Rev. Lett
, vol.94
, pp. 127801
-
-
Si, L.1
Massa, M.V.2
Dalnoki-Veress, K.3
Brown, H.R.4
Jones, R.A.L.5
|