Characterization of wax as a potential diffraction intensity standard for macromolecular crystallography beamlines

Journal of Synchrotron Radiation

Volumn 17, Issue 1, 2010, Pages 53-60

  Brandao Neto, J ^a   Thompson, S P ^a   Lennie, A R ^b   Ferreira, F F ^c   Tang, C C ^a  

^a DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^b DARESBURY LABORATORY   (United Kingdom)

^c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

Beeswax; Macromolecular crystallography; MX intensity standard; Synchrotron powder diffraction

Indexed keywords

BEAM-LINES; BEESWAX; BRAGG REFLECTION; CRYSTALLOGRAPHIC LATTICES; DIFFRACTION INTENSITY; INCIDENT FLUX; MACROMOLECULAR CRYSTALLOGRAPHY; POLYCRYSTALLINITY; POWER-OF-TWO; SAMPLE THICKNESS; SYNCHROTRON BEAMLINES; SYNCHROTRON POWDER DIFFRACTION; SYNCHROTRON X RAY POWDER DIFFRACTION; TEST MEASUREMENTS; THERMAL BEHAVIOURS; THIRD GENERATION; X RAY BEAM;

DIFFRACTION; MACROMOLECULES; MINERALOGY; STANDARDS; SYNCHROTRON RADIATION; SYNCHROTRONS; WAXES; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION;

LIGHT;

PROPOLIS; WAX;

ARTICLE; BRAZIL; CHEMISTRY; FEASIBILITY STUDY; MACROMOLECULE; METHODOLOGY; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; STANDARD; SYNCHROTRON; X RAY CRYSTALLOGRAPHY;

BRAZIL; CRYSTALLOGRAPHY, X-RAY; FEASIBILITY STUDIES; MACROMOLECULAR SUBSTANCES; REFERENCE STANDARDS; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SYNCHROTRONS; WAXES;

EID: 73449114231     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049509040709     Document Type: Article

References (31)

1. Arndt, U. W. & Wonnacott, A. J. (1977). The Rotation Method in Crystallography. Amsterdam: North Holland.
2. Basson, I. & Reynhardt, E. C. (1988). J. Phys. D, 21, 1421-1428.
3. Bourenkov, G. P. & Popov, A. N. (2006). Acta Cryst. D62, 58-64.
4. Chayen, N. E. (1998). Acta Cryst. D54, 8-15.
5. Cheary, R. W. & Coelho, A. (1992). J. Appl. Cryst. 25, 109-121.
6. Cline, J. P., Deslattes, R. D., Staudenmann, J.-L., Kessler, E. G., Hudson, L. T., Henins, A. & Cheary, R.W. (2000). NIST Certificate, SRM 640c Line Position and Line Profile Standard for Powder Diffraction. National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
7. Dix, I., Rühl, S., Fink, L. & Sheldrick, G. M. (2006). Acta Cryst. A62, s21.
8. DjinovićCarugo, K., Helliwell, J. R., Stuhrmann, H. & Weiss, M. S. (2005). J. Synchrotron Rad. 12, 410-419.
9. Ferreira, F. F., Granado, E., Carvalho Jr,W., Kycia, S.W., Bruno, D. & Droppa Jr, R. (2006). J. Synchrotron Rad. 13, 46-53.
10. Forsythe, E. L., Nadarajah, A. & Pusey,M. L. (1999). Acta Cryst. D55, 1005-1011.
11. Hammersley, A. P. (1997). FIT2D: An Introduction and Overview, Technical Report ESRF97HA02T. European Synchrotron Radiation Facility, Grenoble, France.
12. Hammersley, A. P., Svensson, S. O., Hanfland, M., Fitch, A. N. & Hausermann, D. (1996). High Press. Res. 14, 235-248.
13. Huang, T. C., Toraya, H., Blanton, T. N. & Wu, Y. (1993). J. Appl. Cryst. 26, 180-184.
14. Jakoncic, J., Di Michiel, M., Zhong, Z., Honkimaki, V., Jouanneau, Y. & Stojanoff, V. (2006). J. Appl. Cryst. 39, 831-841.
15. Kameda, T. (2005). J. Phys. D, 38, 4313-4320.
16. Kitago, Y., Watanabe, N. & Tanaka, I. (2005). Acta Cryst. D61, 1013-1021.
17. Ladd, M. & Palmer, R. (2003). Structure Determination by X-ray Crystallography, 4th ed., p. 678. New York: Kluwer Academic/ Plenum Publishers.
18. Le Bail, A. (1992). Accuracy in Powder Diffraction II, NIST Special Publication No. 846, edited by E. Prince and J. K. Stalick, p. 213. Gaithersburg: US Department of Commerce.
19. Lennie, A. R., Laundy, D., Roberts,M. A. & Bushnell-Wye, G. (2007). J. Synchrotron Rad. 14, 433-438.
20. Leslie, A. G. W. (1992). Jnt CCP4/ESF-EACMB Newsl. Protein Crystallogr. 26.
21. Lusty, C. J. (1999). J. Appl. Cryst. 32, 106-112.
22. Mueller-Dieckmann, C., Panjikar, S., Tucker, P. A. & Weiss, M. S. (2005). Acta Cryst. D61, 1263-1272.
23. Ravelli, R. B. G., Haselmann-Weiss, U., McGeehan, J. E., McCarthy, A. A., Marquez, J. A., Antony, C., Frangakis, A. S. & Stranzl, G. (2007). J. Synchrotron Rad. 14, 128-132.
24. Shimizu, N., Hirata, K., Hasegawa, K., Ueno, G. & Yamamoto, M. (2007). J. Synchrotron Rad. 14, 4-10.
25. Sorensen, T. L.-M., McAuley, K. E., Flaig, R. & Duke, E. M. H. (2006). Trends Biotechnol. 24, 500-508.
26. Suortti, P., Hastings, J. B. & Cox, D. E. (1985). Acta Cryst. A41, 413-416.
27. Tang, C. C., Thompson, S. P., Hill, T. P.,Wilkin, G. R. &Wagner, U. H. (2007). Z. Kristallogr. Suppl. 26, 153-158.
28. Thompson, S. P., Parker, J. E., Potter, J., Hill, T. P., Birt, A., Cobb, T. M., Yuan, F. & Tang, C. C. (2009). Rev. Sci. Instrum. 80, 075107.
29. Walker, N. & Stuart, D. (1983). Acta Cryst. A39, 158-166.
30. Wong-Ng, W. & Hubbard, C. R. (1987). Powder Diffr. 2, 242-248.
31. Yang, C., Pflugrath, J. W., Courville, D. A., Stence, C. N. & Ferrara, J. D. (2003). Acta Cryst. D59, 1943-1957.