SCOPUS 정보 검색 플랫폼

Volumn 1, Issue 1, 2009, Pages 67-77

An electrospray/inductively coupled plasma dual-source time-of-flight mass spectrometer for rapid metallomic and speciation analysis: Instrument design

(3) Rogers, Duane A a Ray, Steven J a Hieftje, Gary M a

a INDIANA UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COUPLED PLASMA; DEGREE OF FLEXIBILITY; DESIGN AND OPTIMIZATION; DUAL SOURCE; ELECTROSPRAYS; ELEMENTAL SPECIATION; INSTRUMENT DESIGNS; ION OPTICS; MASS ANALYZERS; MICROCHANNEL PLATE DETECTOR; ORTHOGONAL ACCELERATION; PERFORMANCE DATA; REFLECTRONS; SIGNAL OPTIMIZATION; SIMULTANEOUS OPERATION; SPECIATION ANALYSIS; TIME-OF-FLIGHT MASS SPECTROMETERS; TWO STAGE; VACUUM SYSTEM;

ELECTROSPRAY IONIZATION; INDUCTIVELY COUPLED PLASMA; MASS SPECTROMETRY; OPTIMIZATION; VACUUM;

MASS SPECTROMETERS;

ARTICLE; CHEMICAL ANALYSIS; ELECTROSPRAY MASS SPECTROMETRY; INSTRUMENT; MASS SPECTROMETRY; PRIORITY JOURNAL; TIME OF FLIGHT MASS SPECTROMETRY;

EID: 72949088378 PISSN: 17565901 EISSN: 1756591X Source Type: Journal
DOI: 10.1039/b816732j Document Type: Article

Times cited : (26)

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