메뉴 건너뛰기




Volumn 20, Issue 12, 2005, Pages 1326-1331

Absolute methods of quantitation in glow discharge mass spectrometry with a time-of-flight mass analyzer

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CONCENTRATION (PROCESS); MASS SPECTROMETRY; MATRIX ALGEBRA; SENSITIVITY ANALYSIS;

EID: 28944446261     PISSN: 02679477     EISSN: 13645544     Source Type: Journal    
DOI: 10.1039/b513823j     Document Type: Article
Times cited : (16)

References (10)
  • 1
    • 0041706201 scopus 로고    scopus 로고
    • State-of-the-art in inorganic mass spectrometry for analysis of high-purity materials
    • J. S. Becker and H.-J. Dietze, State-of-the-art in inorganic mass spectrometry for analysis of high-purity materials, Int. J. Mass Spectrom.. 2003, 228, 127-150.
    • (2003) Int. J. Mass Spectrom.. , vol.228 , pp. 127-150
    • Becker, J.S.1    Dietze, H.-J.2
  • 2
    • 84994913899 scopus 로고
    • Glow discharge mass spectrometry: An introduction to the technique and its utility
    • F. L. King and W. W. Harrison, Glow discharge mass spectrometry: an introduction to the technique and its utility. Mass Spectrom. Rev., 1990, 9, 285-317.
    • (1990) Mass Spectrom. Rev. , vol.9 , pp. 285-317
    • King, F.L.1    Harrison, W.W.2
  • 3
    • 0035387684 scopus 로고    scopus 로고
    • Standardless semiquantitative analysis of metals using single-shot laser ablation inductively coupled plasma time-of-flight mass spectrometry
    • A. M. Leach and G. M. Hieftje. Standardless semiquantitative analysis of metals using single-shot laser ablation inductively coupled plasma time-of-flight mass spectrometry. Anal. Chem., 2001, 73, 2959-2967.
    • (2001) Anal. Chem. , vol.73 , pp. 2959-2967
    • Leach, A.M.1    Hieftje, G.M.2
  • 4
    • 0000262846 scopus 로고
    • Application of glow discharge mass spectrometry with low mass resolution for in-depth analysis of technical surface layers
    • N. Jakubowski and D. Stuewer, Application of glow discharge mass spectrometry with low mass resolution for in-depth analysis of technical surface layers, J. Anal. At. Spectrom., 1992, 7, 951-958.
    • (1992) J. Anal. At. Spectrom. , vol.7 , pp. 951-958
    • Jakubowski, N.1    Stuewer, D.2
  • 6
    • 0033339176 scopus 로고    scopus 로고
    • Analytical performance of axial inductively coupled plasma time of flight mass spectrometry (ICP-TOFMS)
    • X. Tian, H. Emteborg and F. C. Adams, Analytical performance of axial inductively coupled plasma time of flight mass spectrometry (ICP-TOFMS), J. Anal. At. Spectrom., 1999.14, 1807-1814.
    • (1999) J. Anal. At. Spectrom. , vol.14 , pp. 1807-1814
    • Tian, X.1    Emteborg, H.2    Adams, F.C.3
  • 7
    • 0032811639 scopus 로고    scopus 로고
    • Evaluation of the isotope ratio performance of an axial time-offlight mass spectrometer
    • F. Vanhaecke, L. Moens, R. Dams, L. Allen and S. Georgitis, Evaluation of the isotope ratio performance of an axial time-offlight mass spectrometer. Anal. Chem.. 1999, 71, 3297-3330.
    • (1999) Anal. Chem.. , vol.71 , pp. 3297-3330
    • Vanhaecke, F.1    Moens, L.2    Dams, R.3    Allen, L.4    Georgitis, S.5
  • 8
    • 0036025836 scopus 로고    scopus 로고
    • Characterization of a simple glow discharge coupled to a time of flight mass spectrometer for in-depth profile analysis
    • J. Pisonero, J. Manuel Costa. R. Pereiro. N. Bordel and A. SanzMedel. Characterization of a simple glow discharge coupled to a time of flight mass spectrometer for in-depth profile analysis, J. Anal At. Spectrom., 2002, 17, 1126-1131.
    • (2002) J. Anal At. Spectrom. , vol.17 , pp. 1126-1131
    • Pisonero, J.1    Manuel Costa, J.2    Pereiro, R.3    Bordel, N.4    Sanzmedel, A.5
  • 9
    • 0035982122 scopus 로고    scopus 로고
    • Further development of a simple glow discharge source for direct solid analysis by on-axis time of flight mass spectrometry
    • J. Pisonero-Castro. J. M. Costa-Fernandez. R. Pereiro. N. Bordel and A. Sanz-Medel, Further development of a simple glow discharge source for direct solid analysis by on-axis time of flight mass spectrometry. J. Anal. At. Spectrom., 2002. 17, 786-789.
    • (2002) J. Anal. At. Spectrom. , vol.17 , pp. 786-789
    • Pisonero-Castro, J.1    Costa-Fernandez, J.M.2    Pereiro, R.3    Bordel, N.4    Sanz-Medel, A.5
  • 10
    • 0034740355 scopus 로고    scopus 로고
    • A simple glow discharge ion source for direct solid analysis by on-axis time-of-flight mass spectrometry
    • J. Pisonero. J. M. Costa, R. Pereiro, N. Bordel and A. SanzMedel, A simple glow discharge ion source for direct solid analysis by on-axis time-of-flight mass spectrometry, J. Anal. At. Spectrom., 2001, 16, 1253-1258.
    • (2001) J. Anal. At. Spectrom. , vol.16 , pp. 1253-1258
    • Pisonero, J.1    Costa, J.M.2    Pereiro, R.3    Bordel, N.4    Sanzmedel, A.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.