An interleaved comb ion deflection gate for m/z selection in time‐of‐flight mass spectrometry

Review of Scientific Instruments

Volumn 67, Issue 1, 1996, Pages 68-72

  Vlasak, Paul R ^a   Beussman, Douglas J ^a   Davenport, Michael R ^b   Enke, Christie G ^b  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b UNIVERSITY OF NEW MEXICO   (United States)

Author keywords

BEAM OPTICS; ION BEAMS; MASS RESOLUTION; PULSE SHAPERS; TIME OF FLIGHT MASS SPECTROMETERS

Indexed keywords

EID: 85003848475     PISSN: 00346748     EISSN: 10897623     Source Type: Journal    
DOI: 10.1063/1.1146553     Document Type: Article

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