Formation and identification of graphene

Journal of Nanoelectronics and Optoelectronics

Volumn 4, Issue 2, 2009, Pages 239-242

  Rybin, M G ^a   Kolmychek, P K ^a   Obraztsova, E D ^a   Ezhov, A A ^b   Svirko, O A ^c  

^a PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

^b MOSCOW STATE UNIVERSITY   (Russian Federation)

^c UNIVERSITY OF EASTERN FINLAND   (Finland)

Author keywords

Carbon nanomaterial; Graphene; Graphitic monolayer; Identification; Raman spectroscopy

Indexed keywords

DIFFERENT THICKNESS; GRAPHENE LAYERS; GRAPHENES; GRAPHITIC MONOLAYER; HIGHLY ORIENTED PYROLYTIC GRAPHITE; IDENTIFICATION; INCIDENT LIGHT; LIGHT BEAM; MICRO-MECHANICAL; NANOMATERIAL; SILICON SUBSTRATES; THREE-LAYER SYSTEMS; VISIBLE SPECTRAL RANGE;

FILM THICKNESS; LIGHT REFRACTION; MONOLAYERS; NANOSTRUCTURED MATERIALS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; REFRACTIVE INDEX; REFRACTOMETERS; SEMICONDUCTING SILICON COMPOUNDS; SILICON OXIDES; THIN FILM DEVICES; THIN FILMS; ZINC SULFIDE;

GRAPHITE;

EID: 72749118357     PISSN: 1555130X     EISSN: None     Source Type: Journal    
DOI: 10.1166/jno.2009.1035     Document Type: Article

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