Through-thickness determination of phase composition and residual stresses in thermal barrier coatings using high-energy X-rays

Acta Materialia

Volumn 58, Issue 3, 2010, Pages 943-951

  Weyant, C M ^a   Almer, J ^b   Faber, K T ^a  

^a Northwestern University   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Coatings; Crystalline oxides; Plasma spraying; Residual stresses; X ray diffraction

Indexed keywords

BOND COATS; CRYSTALLINE OXIDES; HIGH ENERGY X RAY; HIGH-ENERGY X-RAY TECHNIQUES; IN-PLANE STRESS; LOCAL PHASE; NICOCRALY; PLASMA SPRAY PROCESS; PLASMA-SPRAYED THERMAL BARRIER COATING; QUENCHING STRESS; SEGMENTATION CRACKS; STRESS GRADIENT; THERMAL EXPANSION MISMATCH; THERMALLY GROWN OXIDE; THICKNESS DETERMINATION;

CRACKS; CRYSTALLINE MATERIALS; DIFFRACTION; HIGH ENERGY PHYSICS; INORGANIC COATINGS; PHASE COMPOSITION; PLASMA JETS; PLASMA SPRAYING; PLASMAS; QUENCHING; RESIDUAL STRESSES; SPRAYED COATINGS; STRESS RELIEF; THERMAL EXPANSION; X RAY DIFFRACTION; X RAYS; YTTRIA STABILIZED ZIRCONIA; ZIRCONIA;

THERMAL BARRIER COATINGS;

EID: 72449200774     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2009.10.010     Document Type: Article

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