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Volumn 16, Issue 5, 2000, Pages 403-410

Diffraction techniques for study of ceramic thermal barrier coatings

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; NEUTRON DIFFRACTION; NONDESTRUCTIVE EXAMINATION; STRAIN RATE; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

EID: 0034543452     PISSN: 02670844     EISSN: None     Source Type: Journal    
DOI: 10.1179/026708400101517387     Document Type: Article
Times cited : (4)

References (24)
  • 5
    • 0003797160 scopus 로고
    • (ed. F. C. Matacotta and G. Ottaviani), Singapore, World Scientific Publishing
    • P. SCARDI: in 'Science and technology of thin films', (ed. F. C. Matacotta and G. Ottaviani), 241-278; 1995, Singapore, World Scientific Publishing.
    • (1995) Science and Technology of Thin Films , pp. 241-278
    • Scardi, P.1
  • 11
    • 0343502295 scopus 로고    scopus 로고
    • Report RB7952, ISIS Experimental Reports, Council for the Central Laboratory of Research Council (CCLRC), UK
    • P. SCARDI, M. LEONI, and I. B. HARRIS: 'Residual stress gradient in ceramic TBCs', Report RB7952, ISIS Experimental Reports, Council for the Central Laboratory of Research Council (CCLRC), UK, 1997.
    • (1997) Residual Stress Gradient in Ceramic TBCs
    • Scardi, P.1    Leoni, M.2    Harris, I.B.3
  • 13
    • 0343066365 scopus 로고    scopus 로고
    • International Center for Diffraction Data (ICDD), PDF-47, 1997, Newtown Square, PA, USA
    • International Center for Diffraction Data (ICDD), PDF-47, 1997, Newtown Square, PA, USA.
  • 16


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.