In-Situ Stress Measurement of Bond Coatings at High Temperature by High-Energy Synchrotron X-Rays

Zairyo/Journal of the Society of Materials Science, Japan

Volumn 52, Issue 7, 2003, Pages 756-763

  Suzuki, Kenji ^a   Tanaka, Keisuke ^b   Akiniwa, Yoshiaki ^b   Kawamura, Masashi ^c   Nishio, Kozi ^c   Okado, Hideki ^c  

^a NIIGATA UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c KAWASAKI HEAVY INDUSTRIES LTD   (Japan)

Author keywords

In situ stress measurement; Residual stress; Synchrotron radiations; Thermal barrier coating

Indexed keywords

HIGH TEMPERATURE EFFECTS; RESIDUAL STRESSES; STRESS ANALYSIS; SYNCHROTRON RADIATION; THERMAL BARRIER COATINGS; X RAYS;

BOND COAT;

HIGH ENERGY PHYSICS;

EID: 0141722503     PISSN: 05145163     EISSN: None     Source Type: Journal    
DOI: 10.2472/jsms.52.756     Document Type: Article

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