Optical properties of LiGaS2: An ab initio study and spectroscopic ellipsometry measurement

Journal of Physics Condensed Matter

Volumn 21, Issue 45, 2009, Pages

  Atuchin, V V ^a   Lin, Z S ^b   Isaenko, L I ^c   Kesler, V G ^d   Kruchinin, V N ^e   Lobanov, S I ^c  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

^b TECHNICAL INSTITUTE OF PHYSICS AND CHEMISTRY   (China)

^c SOBOLEV INSTITUTE OF GEOLOGY AND MINERALOGY   (Russian Federation)

^d Institute of Semiconductor Physics   (Russian Federation)

^e INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO STUDY; BAND STRUCTURE CALCULATION; D ORBITALS; DFT THEORY; DISPERSION CURVES; ELECTRONIC PARAMETERS; FIRST-PRINCIPLES THEORY; OPTICAL PARAMETER; PHOTON ENERGY RANGE; PLANE-WAVE PSEUDOPOTENTIAL METHOD; SPECTROSCOPIC ELLIPSOMETRY MEASUREMENTS; THIOGALLATE; WIDE SPECTRAL RANGE; X RAY PHOTOEMISSION SPECTROSCOPY;

EMISSION SPECTROSCOPY; GALLIUM; OPTICAL CONSTANTS; PROBABILITY DENSITY FUNCTION; SPECTROSCOPIC ELLIPSOMETRY;

OPTICAL PROPERTIES;

EID: 72149113368     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/45/455502     Document Type: Article

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