Microtraps for neutral atoms using superconducting structures in the critical state

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 80, Issue 6, 2009, Pages

  Emmert, A ^a   Lupascu A ^a,b   Brune, M ^a   Raimond, J M ^a   Haroche, S ^a,c   Nogues, G ^a  

^a CNRS   (France)

^b UNIVERSITY OF WATERLOO   (Canada)

^c Paris Sciences et Lettres   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ADJUSTABLE PARAMETERS; ATOM CHIPS; BEAN MODELS; CRITICAL STATE; EXPERIMENTAL OBSERVATION; MEMORY EFFECTS; MICRO-TRAPS; NEUTRAL ATOMS; PARTIAL PENETRATION; PERMANENT CURRENT; QUANTUM SYSTEM; SUPERCONDUCTING STRUCTURE; SUPERCURRENTS; THIN SUPERCONDUCTING FILMS; TRAPPING POTENTIAL; TYPE II SUPERCONDUCTORS;

ATOMS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); MAGNETIC FIELDS; QUANTUM ELECTRONICS; QUANTUM OPTICS; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY;

SUPERCONDUCTING MAGNETS;

EID: 72049100674     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.80.061604     Document Type: Article

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