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European Physical Journal D

Volumn 51, Issue 2, 2009, Pages 173-177

Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip

(6) Emmert, A a Lupascu A a Nogues, G a Brune, M a Raimond, J M a Haroche, S a,b

a CNRS (France)

b l'alimentation et l'Environnement (France)

Author keywords

[No Author keywords available]

Indexed keywords

CRYOGENICS; GOLD DEPOSITS; THERMAL NOISE; WIRE;

ATOMIC CLOUDS; CURRENT NOISE; LOSS RATES; METALLIC GOLD; METALLIC SURFACE; NYQUIST NOISE; TRAPPED ATOMS; ULTRA-COLD;

ATOMS;

EID: 61349092824 PISSN: 14346060 EISSN: 14346079 Source Type: Journal
DOI: 10.1140/epjd/e2009-00001-5 Document Type: Article

Times cited : (48)

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