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Journal of Electron Spectroscopy and Related Phenomena

Volumn 176, Issue 1-3, 2010, Pages 13-17

Electrical double layer at the mineral-aqueous solution interface as probed by XPS with fast-frozen samples

(1) Shchukarev, Andrey a

a UMEÅ UNIVERSITY (Sweden)

Author keywords

EDL; Electrical double layer; Intrinsic charging; Mineral aqueous solution interface; XPS

Indexed keywords

AQUEOUS SOLUTIONS; BINDING ENERGY SHIFTS; CHARGING EFFECT; CHEMICAL COMPOSITIONS; CHEMICAL PROCESS; COUNTERIONS; DIRECT OBSERVATION; EDL; ELECTRICAL DOUBLE LAYERS; ELECTRICAL FIELD; FROZEN SAMPLE; FUTURE DIRECTIONS; ION PAIRING; KEY FEATURE; LIGAND EXCHANGE REACTIONS; SPECIFIC ADSORPTION; WATER REMOVAL; XPS;

ADSORPTION; BINDING ENERGY; ELECTRIC PROPERTIES; ION EXCHANGE; MINERALS; SILICATE MINERALS; X RAY PHOTOELECTRON SPECTROSCOPY;

PHASE INTERFACES;

EID: 71849109426 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/j.elspec.2009.03.020 Document Type: Article

Times cited : (14)

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