XPS at solid-solution interface: Experimental approaches

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 682-685

  Shchukarev, A ^a  

^a UMEÅ UNIVERSITY   (Sweden)

Author keywords

Electrical double layer; Fast freezing; Solid solution interface; XPS

Indexed keywords

ADSORPTION; CONDENSATION; FREEZING; INTERFACES (MATERIALS); OPTICAL PUMPING; PHYSICAL CHEMISTRY; PROBLEM SOLVING; SOLID SOLUTIONS;

ELECTRICAL DOUBLE LAYERS; FAST FREEZING; PHYSICOCHEMICAL PHENOMENA; SOLID-SOLUTION INTERFACES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 33646578188     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2162     Document Type: Conference Paper

References (35)

1. Siegbahn H, Siegbahn K. J. Electron Spectrosc. Relat. Phenom. 1973; 2: 319.
2. Siegbahn H, Asplund L, Kelfve P, Hamrin K, Karlsson L, Siegbahn K. J. Electron Spectrosc. Relat. Phenom. 1974; 5: 1059.
3. Siegbahn H, Asplund L, Kelfve P, Siegbahn K. J. Electron Spectrosc. Relat. Phenom. 1975; 7: 411.
4. Fellner-Felldegg H, Siegbahn H, Asplund L, Kelfve P, Siegbahn K. J. Electron Spectrosc. Relat. Phenom. 1974; 7: 421.
5. Lindberg B, Asplund L, Fellner-Felldegg H, Siegbahn H, Siegbahn K. Chem. Phys. Lett. 1976; 39: 8.
6. Siegbahn H, Svensson S, Lundholm M. J. Electron Spectrosc. Relat. Phenom. 1981; 24: 205.
7. Siegbahn H. J. Phys. Chem. 1985; 89: 897.
8. Faubel M, Steiner B, Toennies JP. J. Chem. Phys. 1997; 106: 9013.
9. Wilson KR, Rüde BS, Catalano T, Schaller RD, Tobin JG, Co DT, Saykally RJ. J. Phys. Chem. B 2001; 105: 3346, DOI: 10.1021/jp010132u.
10. Wilson KR, Schaller RD, Co DT, Saycally RJ, Rude BS, Catalano T, Bozek JD. J. Chem. Phys. 2002; 117: 7738.
11. Winter B, Weber R, Widdra W, Dittmar M, Faubel M, Hertel IV. J. Phys. Chem. A 2004; 108: 2625, DOI: 10.1021/jp030263q.
12. Weber R, Winter B, Schmidt PM, Widdra W, Hertel IV, Dittmar M, Faubel M. J. Phys. Chem. B 2004; 108: 4729, DOI: 10.1021/jp030776x.
13. Winter B, Weber R, Schmidt PM, Hertel IV, Faubel M, Vrbka L, Jungwirth P. J. Phys. Chem. B 2004; 108: 14558, DOI: 10.1021/jp0493531.
14. Ogletree DF, Blum H, Lebedev G, Fadley CS, Hussain Z, Salmeron M. Rev. Sci. Instrum. 2002; 73: 3872.
15. Blum H, Ogletree DF, Fadley CS, Hussain Z, Salmeron M. J. Phys.: Condens. Matter 2002; 14: L227.
16. Burger K, Fluck E. Inorg. Nucl. Chem. Lett. 1974; 10: 171.
17. Burger K, Fluck E, Binder H, Varhelyi CS. J. Inorg Nucl. Chem. Lett 1975; 37: 55.
18. Burger K. J. Electron Spectrosc. Relat. Phenom. 1978; 14: 405.
19. Burger K, Tschimirov F, Ebel H. J. Electron Spectrosc. Relat. Phenom. 1977; 10: 461.
20. Miksche G, Miksche H, Murauer H, Persy K. J. Electron Spectrosc. Relat. Phenom. 1977; 10: 423.
21. Henderson MA. Surf. Sci. Rep. 2002; 46: 1.
22. Ratner BD, Weathersby PK, Hoffman AS, Kelly MA, Scharpen LH. J. Appl. Polym. Sci. 1978; 22: 643.
23. Ratner BD, Horbet TA, Shuttleworth D, Tomas HR. J. Colloid Interface Sci. 1981; 83: 630.
24. Lewis KB, Ratner BD. J. Colloid Interface Sci. 1993; 159: 77.
25. Lukas J, Sodhi RN, Sefton MV. J. Colloid Interface Sci. 1995; 174: 421.
26. Ratner BD. Surf. Interface Anal. 1995; 23: 521.
27. Gelabert A, Pokrovsky OS, Schott J, Boudou A, Feurtet-Mazel A, Mielczarski J, Mielczarski E, Mesmer-Dudons N, Spalla O. Geochim. et Cosmochim. Acta 2004; 68: 4039, DOI: 10.1016/j.gca.2004.01.11.
28. Shchukarev A, Rosenquist J, Sjöberg S. J. Electron Spectrosc. Relat. Phenom. 2004; 171:137, DOI: 10.1016/j.elspec.2004.02.095.
29. Ramstedt M, Shchukarev AV, Sjöberg S. Surf. Interface Anal. 2002; 34: 632, DOI: 10.1002/sia.1376.
30. Shchukarev A, Sjöberg S. Surf. Sci. 2005; 584: 106, DOI:10.1016/j.susc.2005.01.060.
31. Ramstedt M, Norgren C, Sheals J, Shchukarev A, Sjöberg S. Surf. Interface Anal. 2004; 36:1074, DOI: 10.1002/sia.1844.
32. Ramstedt M, Norgren C, Shchukarev A, Sjöberg S, Persson P. J. Colloid Interface Sci 2005; 285: 493, DOI: 10.1016/j.jcis.2004.12.003.
33. Fenter P, Struchio NC. Prog. Surf. Sci. 2004; 77: 171, DOI: 10.1016/j.progsurf.2004.12.001.
34. Kosmulski M. J. Colloid Interface Sci. 1998; 208: 543.
35. D'Agostino AT, Hansen WN. Surf. Sci. 1986; 165: 268.