XPS study of the silica-water interface

Journal of Electron Spectroscopy and Related Phenomena

Volumn 137-140, Issue SPEC. ISS., 2004, Pages 171-176

  Shchukarev, A ^a   Rosenqvist, J ^a   Sjoberg S ^a  

^a UMEÅ UNIVERSITY   (Sweden)

Author keywords

"Built in" potential; Silica water interface; Surface charge; XPS

Indexed keywords

ADSORPTION; INTERFACES (MATERIALS); IONIC STRENGTH; KINETIC ENERGY; PH EFFECTS; SILICA; SURFACE PHENOMENA;

'BUILT-IN' POTENTIALS; ATOMIC RATIOS; SILICA-WATER INTERFACES; SURFACE CHARGES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 2942538608     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.02.095     Document Type: Conference Paper

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